JTCS -- Index by Author (Jul 1996; 112, Number 1)

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Year:		Vol:		Page:

Index by Author: Jul 1996; 112 (1) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Agarwal, Surendra K. [Abstract] [Full Text]; Allen, Keith B. [Full Text]; Amano, Jun [Full Text]; Amato, Mary T. [Abstract] [Full Text]; Angeletti, Carlo Alberto [Abstract] [Full Text]; Angelini, Gianni D. [Abstract] [Full Text]; Anstadt, Mark P. [Abstract] [Full Text]; Aoe, Motoi [Abstract] [Full Text]; Ashimura, Kohichi [Full Text]
B: Bélisle, Sylvain [Abstract] [Full Text]; Baufreton, Christophe [Abstract] [Full Text]; Bernal, Jose M. [Full Text]; Bigler, Dennis [Abstract] [Full Text]; Bigras, Jean-Luc [Abstract] [Full Text]; Binns, Oliver A. R. [Abstract] [Full Text]; Blitz, Arie [Abstract] [Full Text]; Boutin, Christine [Abstract] [Full Text]; Brenøe, Jørgen [Abstract] [Full Text]; Brown, R. P. [Abstract] [Full Text]; Brunner, Martha J. [Abstract] [Full Text]; Bryan, Alan J. [Abstract] [Full Text]; Buchanan, Scott A. [Abstract] [Full Text]
C: Camporesi, Enrico M. [Abstract] [Full Text]; Cartier, Raymond [Abstract] [Full Text]; Chang, Paul [Abstract] [Full Text]; Chella, Antonio [Abstract] [Full Text]; Chen, Mary A. [Abstract] [Full Text]; Cherian, K. M. [Abstract] [Full Text]; Chong, Albert [Abstract] [Full Text]; Christakis, George T. [Abstract] [Full Text]; Consten, E. C. J. [Abstract] [Full Text]; Cooper, Joel D. [Abstract] [Full Text]; Cooper, Joel D. [Abstract] [Full Text]; Cope, Jeffrey T. [Abstract] [Full Text]; Cotroneo, Joseph V. [Full Text]
D: Daenen, Wim [Full Text]; David, Tirone E. [Abstract] [Full Text]; DeLima, Nuno F. [Abstract] [Full Text]; Dias, Omar Semper [Abstract] [Full Text]; DiDonato, Roberto M. [Full Text]; Donahoo, James S. [Full Text]; Dongelmans, D. A. [Abstract] [Full Text]; Dresler, Carolyn M. [Abstract] [Full Text]; Drinkwater, Davis C. [Abstract] [Full Text]; Duurkens, Vincent A. M. [Abstract] [Full Text]
E: Eijsman, L. [Abstract] [Full Text]; Ernst, J. M. P. G. [Abstract] [Full Text]; Esmore, D. S. [Abstract] [Full Text]
F: Federman, Micheline [Abstract] [Full Text]; Flameng, Willem [Full Text]; Foster, Andrew H. [Abstract] [Full Text]; Fukai, Ichirou [Abstract] [Full Text]; Fukaya, Yukio [Full Text]; Furuse, Akira [Abstract] [Full Text]; Furuse, Akira [Full Text]
G: Gagnon, Line [Abstract] [Full Text]; Gandarillas, Marco [Abstract] [Full Text]; Ganjoo, Anoop K. [Full Text]; Ghosh, Probal K. [Abstract] [Full Text]; Gold, Jeffrey P. [Full Text]; Goldin, Marshall [Full Text]; Goto, Hiraaki [Full Text]; Gregori, Francisco [Full Text]
H: Hébert, Yves [Abstract] [Full Text]; Hammon, John W. [Full Text]; Haniuda, Masayuki [Abstract] [Full Text]; Hara, Fujio [Abstract] [Full Text]; Hardy, Jean-François [Abstract] [Full Text]; Hasegawa, Seiki [Abstract] [Full Text]; Heitmiller, Richard F. [Abstract] [Full Text]; Hendry, Paul J. [Abstract] [Full Text]; Henny, Ch. P. [Abstract] [Full Text]; Hill, Jonathan G. [Full Text]; Hirata, Kazuhiko [Abstract] [Full Text]; Hurlé, Aquilino [Abstract] [Full Text]; Huysmans, Hans A. [Abstract] [Full Text]
I: Ignarro, Louis J. [Abstract] [Full Text]; Ikonomidis, John S. [Abstract] [Full Text]; Imagawa, Hiroshi [Full Text]; Ivanov, Joan [Abstract] [Full Text]; Izzat, Mohammad Bashar [Abstract] [Full Text]
J: Janni, Alberto [Abstract] [Full Text]; Johnson, W. Dudley [Full Text]; Jonsson, Torsten [Abstract] [Full Text]; Journois, Didier [Abstract] [Full Text]
K: Kadoba, Keishi [Full Text]; Kagisaki, Koji [Full Text]; Keats, Arthur S. [Full Text]; Kelder, J. C. [Abstract] [Full Text]; Khargi, Krishna [Abstract] [Full Text]; Khoury, Wassim [Abstract] [Full Text]; Kirchhoff, P. G. [Full Text]; Kiriyama, Masanobu [Abstract] [Full Text]; Knaepen, Paul J. [Abstract] [Full Text]; Knaepen, P. J. [Abstract] [Full Text]; Kohno, Tadasu [Full Text]; Kondo, Kaoru [Abstract] [Full Text]; Kondo, Satoshi [Abstract] [Full Text]; Kotsuka, Yutaka [Abstract] [Full Text]; Krause, Albert H. [Full Text]; Kron, Irving L. [Abstract] [Full Text]; Krukenkamp, Irvin B. [Abstract] [Full Text]; Kubota, Hiroshi [Abstract] [Full Text]; Kuroda, Hideo [Full Text]
L: Laks, Hillel [Abstract] [Full Text]; Lasley, Robert D. [Full Text]; Lawson, C. [Abstract] [Full Text]; LeBoeuf, Mary Berry [Full Text]; Leca, Francine [Abstract] [Full Text]; Leclerc, Yves [Abstract] [Full Text]; Lee, Jeongryul [Abstract] [Full Text]; Lemmer, John H. [Full Text]; Levitsky, Sidney [Abstract] [Full Text]; Long, William B. [Full Text]; Lowe, James E. [Abstract] [Full Text]; Lucchi, Marco [Abstract] [Full Text]
M: Manouguian, S. [Full Text]; Masaoka, Akira [Abstract] [Full Text]; Matsuda, Hikaru [Full Text]; Mauney, Michael C. [Abstract] [Full Text]; McCormick, John R. [Full Text]; McCrindle, Brian W. [Abstract] [Full Text]; McCully, James D. [Abstract] [Full Text]; McLaughlin, Joseph S. [Abstract] [Full Text]; Mentzer, Robert M. [Full Text]; Metzdorff, Mark T. [Full Text]; Meyns, Bart [Full Text]; Minami, Manabu [Full Text]; Mitra, Ramon [Full Text]; Mittal, Pramod K. [Abstract] [Full Text]; Mohr, F. W. [Full Text]; Molloy, Thomas A. [Full Text]; Murakawa, Yuji [Abstract] [Full Text]; Murthy, K. S. [Abstract] [Full Text]; Mussi, Alfredo [Abstract] [Full Text]
N: Nakajima, Jun [Full Text]; Newby, Andrew C. [Abstract] [Full Text]; Nistal, J. Francisco [Abstract] [Full Text]; Niwa, Hiroshi [Abstract] [Full Text]; Nomura, Fumikazu [Full Text]
O: Ohtsuka, Toshiya [Full Text]; Okabayashi, Kan [Abstract] [Full Text]; Okamoto, Kazufumi [Full Text]; Okies, J. Edward [Full Text]; Olsen, Johnny [Abstract] [Full Text]; Oyarzun, Rodrigo [Full Text]
P: Page, U. Scott [Full Text]; Parenti, Giovanni [Abstract] [Full Text]; Patterson, G. Alexander [Abstract] [Full Text]; Patterson, G. Alexander [Abstract] [Full Text]; Peerenboom, Patrick [Full Text]; Pellerin, Michel [Abstract] [Full Text]; Perrault, Jean [Abstract] [Full Text]; Pistolesi, Massimo [Abstract] [Full Text]; Plokker, H. W. M. [Abstract] [Full Text]; Plunkett, Mark D. [Abstract] [Full Text]
Q: Quanjer, Philip H. [Abstract] [Full Text]
R: Rao, Vivek [Abstract] [Full Text]; Rebeyka, Ivan M. [Abstract] [Full Text]; Revuelta, José M. [Abstract] [Full Text]; Revuelta, Jose M. [Full Text]; Robitaille, Danielle [Abstract] [Full Text]; Rossi, Giuseppe [Abstract] [Full Text]; Roy, Micheline [Abstract] [Full Text]
S: Sakaguchi, Masayuki [Full Text]; Sander-Jensen, Kåre [Abstract] [Full Text]; Sano, Tetsuya [Full Text]; Sharma, Rohit R. [Abstract] [Full Text]; Shinohara, Masanori [Full Text]; Shiraishi, Takeshi [Abstract] [Full Text]; Shockey, Kimberly S. [Abstract] [Full Text]; Slogoff, Stephen [Full Text]; St. Louis, James D. [Abstract] [Full Text]
T: Takano, Tamaki [Full Text]; Tamisier, Daniel [Abstract] [Full Text]; Taniguchi, Kazuhiro [Full Text]; Terasaki, Hidenori [Full Text]; Tribble, Curtis G. [Abstract] [Full Text]; Tsukube, Takuro [Abstract] [Full Text]; Tsunemoto, Hideo [Full Text]
U: Utoh, Junichi [Full Text]
V: van Brussel, B. L. [Abstract] [Full Text]; van der Velde, Edo A. [Abstract] [Full Text]; van Oers, M. H. J. [Abstract] [Full Text]; van Son, Jacques A. M. [Full Text]; Vandommele, Johan [Full Text]; Vermeulen, F. E. E. [Abstract] [Full Text]; Versteegh, Michel M. I. [Abstract] [Full Text]; Verzijlbergen, Fred F. [Abstract] [Full Text]; Vinten-Johansen, Jakob [Full Text]; Vlasselaers, Dirk [Full Text]; Voors, A. A. [Abstract] [Full Text]; Vouhé, Pascal [Abstract] [Full Text]
W: Wehberg, Kurt E. [Abstract] [Full Text]; Weisel, Richard D. [Abstract] [Full Text]; Winkler, Thomas R. [Full Text]; Wise, Robert M. [Abstract] [Full Text]
Y: Yagyu, Kuniyoshi [Full Text]; Yagyu, Kuniyoshi [Abstract] [Full Text]; Yamakawa, Yosuke [Abstract] [Full Text]