JTCS -- Index by Author (Dec 1996; 112, Number 6)

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	Author:		Keyword(s):
Year:		Vol:		Page:

Index by Author: Dec 1996; 112 (6) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abecasis, Nuno [Abstract] [Full Text]; Abolhoda, Amir [Abstract] [Full Text]; Acar, Christophe [Full Text]; Acar, Christoph [Abstract] [Full Text]; Agnino, Alfonso [Full Text]; Akaishi, Takashi [Abstract] [Full Text]; Akomea-Agyin, C. [Full Text]; Anderson, Betty J. [Abstract] [Full Text]; Andréassian, Bernard [Abstract] [Full Text]; Aufiero, Thomas X. [Abstract] [Full Text]
B: Bailey, C. Martin [Abstract] [Full Text]; Bando, Ko [Abstract] [Full Text]; Barak, Chen [Abstract] [Full Text]; Belli, Emre [Abstract] [Full Text]; Benetti, Federico [Abstract] [Full Text]; Bingol, Hakan [Abstract] [Full Text]; Binns, Oliver A. R. [Abstract] [Full Text]; Blanche, Carlos [Abstract] [Full Text]; Boonstra, Piet W. [Abstract] [Full Text]; Brown, John W. [Abstract] [Full Text]; Bruniaux, Jacqueline [Abstract] [Full Text]; Buchanan, Scott A. [Abstract] [Full Text]; Buckberg, Gerald D. [Full Text]; Burt, Michael E. [Abstract] [Full Text]
C: Carpentier, Alain F. [Abstract] [Full Text]; Carrel, T. [Full Text]; Chachques, Juan-Carlos [Abstract] [Full Text]; Cheng, Huiming [Abstract] [Full Text]; Christakis, George T. [Abstract] [Full Text]; Chu, Shu-Hsun [Full Text]; Ciçek, Sertaç [Abstract] [Full Text]; Cicala, Pasquale [Full Text]; Cohen, Mabelle H. [Abstract] [Full Text]; Cooper, Joel D. [Abstract] [Full Text]; Cope, Jeffrey T. [Abstract] [Full Text]; Cox, James L. [Full Text]; Craver, Joseph M. [Abstract] [Full Text]; Czer, Lawrence S. C. [Abstract] [Full Text]
D: Danielson, Gordon K. [Abstract] [Full Text]; David, Tirone E. [Abstract] [Full Text]; de Leval, Sponsor: Marc R. [Abstract] [Full Text]; de Leval, Marc R. [Abstract] [Full Text]; de Leval, Marc R. [Abstract] [Full Text]; de Luca, Luigi [Full Text]; Deaton, David W. [Abstract] [Full Text]; Del Rizzo, Dario F. [Abstract] [Full Text]; DeLima, Nuno F. [Abstract] [Full Text]; Delius, Ralph E. [Abstract] [Full Text]; Delius, Ralph E. [Abstract] [Full Text]; Demirkiliç, Ufuk [Abstract] [Full Text]; Deverall, P. B. [Full Text]; Duchatelle, Jean-Pierre [Abstract] [Full Text]; Dyke, Cornelius [Full Text]
E: Elliott, Martin J. [Abstract] [Full Text]; Elliott, Martin J. [Abstract] [Full Text]; Elliott, Martin J. [Abstract] [Full Text]; Engelman, Richard M. [Abstract] [Full Text]
F: Fantini, Prof. Fernando [Full Text]; Feldt, Robert H. [Abstract] [Full Text]; Flack, Joseph E. [Abstract] [Full Text]; Fondacone, Corrado [Full Text]; Frost, Adaani [Abstract] [Full Text]; Furnary, Anthony P. [Abstract] [Full Text]
G: Giomarelli, Pierpaolo [Abstract] [Full Text]; Goldman, Bernard S. [Abstract] [Full Text]; Gontijo, Prof. Bayard [Full Text]; Grandjean, Jan G. [Abstract] [Full Text]; Gregory, Cheryl A. [Abstract] [Full Text]; Grunkemeier, Gary L. [Abstract] [Full Text]; Guyton, Robert A. [Abstract] [Full Text]
H: Håkanson, Erik [Abstract] [Full Text]; Hardesty, Robert L. [Abstract] [Full Text]; Haw, Marcus P. [Abstract] [Full Text]; Hawkins, John A. [Abstract] [Full Text]; Haydar, Sam [Abstract] [Full Text]; Herberhold, Claus [Abstract] [Full Text]; Higuchi, Norio [Abstract] [Full Text]; Hodakowski, George T. [Abstract] [Full Text]; Houyel, Lucile [Abstract] [Full Text]; Hsu, Ron-Bin [Full Text]
I: Inamo, Jocelyn [Abstract] [Full Text]; Ishikura, Fuminobu [Full Text]
J: Jacobs, Jeffrey P. [Abstract] [Full Text]; Jatene, Adib D. [Abstract] [Full Text]; Jessen, Michael E. [Abstract] [Full Text]; Joachimsson, P. O. [Abstract] [Full Text]; Jonas, Richard A. [Abstract] [Full Text]; Jones, Ellis L. [Abstract] [Full Text]; Jorfeldt, Lennart [Abstract] [Full Text]
K: Kaneda, Iwao [Abstract] [Full Text]; Kass, Robert [Abstract] [Full Text]; Keshavjee, Shafique H. [Abstract] [Full Text]; King, Robert C. [Abstract] [Full Text]; King, Spencer B. [Abstract] [Full Text]; Klepetko, Walter [Abstract] [Full Text]; Kron, Irving L. [Abstract] [Full Text]; Kuralay, Erkan [Abstract] [Full Text]; Kuramoto, Jun-ichi [Abstract] [Full Text]; Kuriya, Yoshiki [Abstract] [Full Text]
L: Lacour-Gayet, François [Abstract] [Full Text]; Laussen, Peter C. [Abstract] [Full Text]; Li, Jiun-Yi [Full Text]; Lidov, Hart G. W. [Abstract] [Full Text]; Lin, Fang-Yue [Full Text]; Lynch, John [Abstract] [Full Text]
M: Malloy, Craig R. [Abstract] [Full Text]; Maniscalco, Stephen P. [Abstract] [Full Text]; Manley, Jenny [Abstract] [Full Text]; Marek, Chris A. [Abstract] [Full Text]; Mariani, Massimo A. [Abstract] [Full Text]; Matloff, Jack M. [Abstract] [Full Text]; Matsuwaka, Ryousuke [Full Text]; Maziak, Donna E. [Abstract] [Full Text]; McGough, Edwin C. [Abstract] [Full Text]; Meier, B. [Full Text]; Meyer, B. J. [Full Text]; Minich, L. LuAnn [Abstract] [Full Text]; Mitsuno, Masataka [Full Text]; Miura, Takuya [Abstract] [Full Text]; Mohacsi, P. [Full Text]; Moreira, Luiz F. P. [Abstract] [Full Text]
N: Nawata, Sumihiko [Abstract] [Full Text]; Nessim, Sharon [Abstract] [Full Text]; Neuhof, Heinz [Full Text]; Nilsson, Lennart [Abstract] [Full Text]; Novick, Richard J. [Abstract] [Full Text]
O: Özal, Ertugrul [Abstract] [Full Text]; Özturk, Ömer Y. [Abstract] [Full Text]; Orsmond, Garth S. [Abstract] [Full Text]
P: Patterson, G. Alexander [Abstract] [Full Text]; Patterson, G. Alexander [Abstract] [Full Text]; Pearson, F. Griffith [Abstract] [Full Text]; Pedrazzini, G. B. [Full Text]; Pekow, Penelope S. [Abstract] [Full Text]; Planché, Claude [Abstract] [Full Text]; Pleet, A. Bernard [Abstract] [Full Text]; Plessis, Adre du [Abstract] [Full Text]; Poeml, Peter [Full Text]
R: Rademecker, Marc A. [Abstract] [Full Text]; Raissi, Sharo [Abstract] [Full Text]; Reed, Mark K. [Abstract] [Full Text]; Reidy, J. F. [Full Text]; Ross, Howard M. [Abstract] [Full Text]; Rousou, John A. [Abstract] [Full Text]
S: Sachar, Komal S. [Abstract] [Full Text]; Sakakibara, Tetsuo [Full Text]; Sani, Guido [Abstract] [Full Text]; Scannell, J. Gordon [Full Text]; Schäfers, Hans-Joachim [Abstract] [Full Text]; Scheld, Hans H. [Full Text]; Schmid, Christof [Full Text]; Sekine, Eri [Abstract] [Full Text]; Sekine, Yasuo [Abstract] [Full Text]; Serena, Donato [Full Text]; Serraf, Alain [Abstract] [Full Text]; Sharp, Thomas G. [Abstract] [Full Text]; Shin'oka, Toshiharu [Abstract] [Full Text]; Shiraishi, Yugi [Abstract] [Full Text]; Shockey, Kimberly S. [Abstract] [Full Text]; Shum-Tim, Dominique [Abstract] [Full Text]; Soeparwata, Rasjid [Full Text]; Stark, Jaroslav [Abstract] [Full Text]; Stark, Jaroslav [Abstract] [Full Text]; Starr, Albert [Abstract] [Full Text]; Stitt, Larry [Abstract] [Full Text]; Stolf, Noedir [Abstract] [Full Text]; Sturtevant, Jane E. [Abstract] [Full Text]; Sun, Kyung [Abstract] [Full Text]; Sundaresan, R. Sudhir [Abstract] [Full Text]; Svedjeholm, Rolf [Abstract] [Full Text]; Svensson, Lars G. [Abstract] [Full Text]; Swanson, Jeffrey S. [Abstract] [Full Text]
T: Takkenberg, Johanna M. [Abstract] [Full Text]; Tani, Lloyd Y. [Abstract] [Full Text]; Tatar, Harun [Abstract] [Full Text]; Theodoro, David A. [Abstract] [Full Text]; Todd, Thomas R. J. [Abstract] [Full Text]; Toscano, Michele [Abstract] [Full Text]; Toyoda, Tsuneo [Abstract] [Full Text]; Trento, Alfredo [Abstract] [Full Text]; Tribble, Curtis G. [Abstract] [Full Text]; Trulock, Elbert P. [Abstract] [Full Text]; Turrentine, Mark W. [Abstract] [Full Text]
V: Van Nostrand, Peter [Abstract] [Full Text]; Vanhanen, Ingemar [Abstract] [Full Text]; Vitale, Nicola [Full Text]; Vrandecic, Prof. Mario [Full Text]
W: Wakabayashi, Akio [Abstract] [Full Text]; Winton, Timothy L. [Abstract] [Full Text]
Y: Yagura, Akihiko [Full Text]; Yoshikawa, Masato [Full Text]