JTCS -- Index by Author (Apr 1998; 115, Number 4)

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	Author:		Keyword(s):
Year:		Vol:		Page:

Index by Author: Apr 1998; 115 (4) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abman, Steven H. [Abstract] [Full Text]; Alessandrini, Francesco [Abstract] [Full Text]; Alexi-Meskhisvili, Valdimir [Abstract] [Full Text]; Altès, Albert [Abstract] [Full Text]; Altorki, Nasser K. [Abstract] [Full Text]; Amanzio, Martina [Abstract] [Full Text]; Antretter, Herwig [Full Text]; Arís, Alejandro [Abstract] [Full Text]; Austin, Conal B. [Abstract] [Full Text]
B: Bacal, Fernando [Abstract] [Full Text]; Backer, Carl L. [Abstract] [Full Text]; Baumgartner, R. W. [Abstract] [Full Text]; Beierlein, Wolfram [Abstract] [Full Text]; Benedetti, Fabrizio [Abstract] [Full Text]; Bergamasco, Bruno [Abstract] [Full Text]; Bergamasco, Luciana [Abstract] [Full Text]; Berger, Felix [Abstract] [Full Text]; Berrebi, Alain [Abstract] [Full Text]; Bertolini, Paolo [Full Text]; Bocchi, Edimar A. [Abstract] [Full Text]; Bochner, Melissa A. [Full Text]; Bonatti, Johannes [Full Text]; Bonser, Robert S. [Abstract] [Full Text]; Borrás, Xavier [Abstract] [Full Text]; Bove, Edward L. [Abstract] [Full Text]; Brady, Peter [Full Text]; Bruins, Peter [Full Text]
C: Calafiore, Antonio M. [Abstract] [Full Text]; Camici, Paolo G. [Abstract] [Full Text]; Carballido, Jorge [Full Text]; Carpentier, Alain [Abstract] [Full Text]; Carreras, Francesc [Abstract] [Full Text]; Carrington, Russell [Full Text]; Casadio, Caterina [Abstract] [Full Text]; Champsaur, Gérard [Abstract] [Full Text]; Chen, Moy-Fong [Abstract] [Full Text]; Cho, Peter W. [Abstract] [Full Text]; Cianci, Roberto [Abstract] [Full Text]; Conlan, A. Alan [Full Text]; Contini, Marco [Abstract] [Full Text]; Couëtil, Jean-Paul [Abstract] [Full Text]; Crameri, Regina [Full Text]; Curtil, Alain [Abstract] [Full Text]
D: d'Attellis, Nicola [Abstract] [Full Text]; Deslauriers, Roxanne [Abstract] [Full Text]; Dominguez, José M [Abstract] [Full Text]; Dunham, Michael E. [Abstract] [Full Text]; Durham, Lucian A. [Abstract] [Full Text]
E: Eckstein, Friedrich S. [Abstract] [Full Text]; Eijsman, León [Full Text]; Erik Hack, C. [Full Text]; Ewert, Peter [Abstract] [Full Text]
F: Fontcuberta, Jordi [Abstract] [Full Text]; Franck, Michel [Abstract] [Full Text]; Fujita, Masatoshi [Full Text]
G: Gallina, Sabina [Abstract] [Full Text]; Garner, Sandra S. [Abstract] [Full Text]; Gaudino, Mario [Abstract] [Full Text]; Gennaro, Mark [Full Text]; Georgiadis, D. [Abstract] [Full Text]; Giaid, Adel [Abstract] [Full Text]; Giammarco, Gabriele Di [Abstract] [Full Text]; Giobbe, Roberto [Abstract] [Full Text]; Giorgi, Maria C. P. [Abstract] [Full Text]; Glieca, Franco [Abstract] [Full Text]; Goetz, Alwin E. [Abstract] [Full Text]; Goormastic, Marlene [Abstract] [Full Text]; Goto, Yoshikazu [Full Text]; Groh, Joachim [Abstract] [Full Text]
H: Hangler, Herbert [Full Text]; Hartman, Alan [Full Text]; Hatori, Nobuo [Abstract] [Full Text]; Heinemann, Markus K. [Abstract] [Full Text]; Hetzer, Roland [Abstract] [Full Text]; Hines, George L. [Full Text]; Hirai, Shinji [Full Text]; Hobbs, Robert E. [Abstract] [Full Text]; Holinger, Lauren D. [Abstract] [Full Text]; Horam, Christopher [Full Text]; Horton, Richard [Abstract] [Full Text]; Huang, Yi Fei [Full Text]; Hunyor, Stephen N. [Full Text]
I: Ichikawa, Yukio [Full Text]; Iovino, Teresa [Abstract] [Full Text]; Ishikawa, Mikio [Abstract] [Full Text]; Ishimaru, Shin [Abstract] [Full Text]; Ivy, D. Dunbar [Abstract] [Full Text]; Iwase, Tomoyuki [Full Text]
J: Jansen, Piet G. M. [Full Text]; Jatene, Adib D. [Abstract] [Full Text]
K: Karatschai, R. [Abstract] [Full Text]; Kariyazono, Hiroko [Full Text]; Kawaguchi, Osamu [Full Text]; Kawaguchi, Satoshi [Abstract] [Full Text]; Kihara, Yasuki [Full Text]; Kinsella, John P. [Abstract] [Full Text]; Kitagawa, Tetsuya [Abstract] [Full Text]; Koizumi, Nobusato [Abstract] [Full Text]; Kubo, Shigeru [Full Text]; Kuhnle, Gerhard E. H. [Abstract] [Full Text]
L: Lajos, Paul [Abstract] [Full Text]; Lange, Peter E. [Abstract] [Full Text]; Lange, Thomas [Abstract] [Full Text]; Lee, K. Adam [Full Text]; Lee, Allan G. L. [Abstract] [Full Text]; Lincoln, Christopher [Full Text]; Lindner, A. [Abstract] [Full Text]; Littler, William A. [Abstract] [Full Text]; Lock, James E. [Full Text]; Loulmet, Didier F. [Abstract] [Full Text]; Luciani, Nicola [Abstract] [Full Text]; Luciani, Giovanni Battista [Full Text]
M: Müller, Ludwig C. [Full Text]; Maddestra, Nicola [Abstract] [Full Text]; Maggi, Giuliano [Abstract] [Full Text]; Manteiga, Rosa [Abstract] [Full Text]; Martinot, Stéphane [Abstract] [Full Text]; Mateo, Jose [Abstract] [Full Text]; Matsuura, Yuichiro [Full Text]; Mavroudis, Constantine [Abstract] [Full Text]; Mazzucco, Alessandro [Full Text]; McCarthy, Patrick M. [Abstract] [Full Text]; Messmer, Konrad [Abstract] [Full Text]; Miyamoto, Yoshifumi [Abstract] [Full Text]; Mizuno, Tomohiro [Abstract] [Full Text]; Moreira, Luiz Felipe P. [Abstract] [Full Text]; Morita, Satoru [Full Text]; Moriyama, Yukinori [Full Text]; Morton Bolman, R. [Full Text]; Mosca, Ralph S. [Abstract] [Full Text]
N: Nagdyman, Nicole [Abstract] [Full Text]; Nakamura, Kazuo [Full Text]; Noishiki, Yasuharu [Full Text]
O: O'Brien, Mark F. [Full Text]; Obitsu, Yukio [Abstract] [Full Text]; Okada, Kenji [Full Text]; Okada, Morihito [Abstract] [Full Text]; Oliaro, Alberto [Abstract] [Full Text]; Oriaku, Godwin I. [Abstract] [Full Text]; Orihashi, Kazumasa [Full Text]
P: Pagano, Domenico [Abstract] [Full Text]; Paloscia, Leonardo [Abstract] [Full Text]; Pappas, Dean [Full Text]; Parga, José R. [Abstract] [Full Text]; Park, Chang-Hee [Full Text]; Pasic, Miralem [Abstract] [Full Text]; Possati, Gianfederico [Abstract] [Full Text]
R: Reichenspurner, Hermann [Abstract] [Full Text]; Ricco, Claudia [Abstract] [Full Text]; Rinaldi, Raúl García [Full Text]; Robin, Jacques [Abstract] [Full Text]
S: Sade, Robert M. [Abstract] [Full Text]; Sakamoto, Tohru [Abstract] [Full Text]; Salerno, Tomas A. [Abstract] [Full Text]; Sato, Tatsuro [Full Text]; Saunders, John K. [Abstract] [Full Text]; Scarth, Gordon [Abstract] [Full Text]; Scheule, Albertus M. [Abstract] [Full Text]; Scipioni, Giovanni [Abstract] [Full Text]; Segawa, Daisuke [Abstract] [Full Text]; Serrick, Cyril [Abstract] [Full Text]; Shen, Jie [Abstract] [Full Text]; Shennib, Hani [Abstract] [Full Text]; Shikata, Hiroo [Full Text]; Shimizu, Masafumi [Abstract] [Full Text]; Skinner, David B. [Abstract] [Full Text]; Smedira, Nicholas O. [Abstract] [Full Text]; Soltero, Ernesto R. [Full Text]; Somorjai, Ray [Abstract] [Full Text]; Souto, Juan Carlos [Abstract] [Full Text]; Starling, Randall C. [Abstract] [Full Text]; Stolf, Noedir A. G. [Abstract] [Full Text]; Sueda, Taijiro [Full Text]; Sueshiro, Masafumi [Full Text]; Sun, Jiankang [Abstract] [Full Text]; Sunamori, Makoto [Abstract] [Full Text]
T: Taira, Akira [Full Text]; Tamaki, Shun-ichi [Full Text]; Tanaka, Susumu [Abstract] [Full Text]; Tanaka, Terumitsu [Full Text]; Teodori, Giovanni [Abstract] [Full Text]; Tian, Ganghong [Abstract] [Full Text]; Townend, Jonathan N. [Abstract] [Full Text]; Toyohira, Hitoshi [Full Text]; Tronc, François [Abstract] [Full Text]; Tsubota, Noriaki [Abstract] [Full Text]
U: Uber, Walter E. [Abstract] [Full Text]; Uriuda, Yozo [Abstract] [Full Text]
V: Vargo, Rita L. [Abstract] [Full Text]; Vedrinne, Catherine [Abstract] [Full Text]; Velthuis, Henk te [Full Text]; Vighetti, Sergio [Abstract] [Full Text]; Vitolla, Giuseppe [Abstract] [Full Text]
W: Wagner, Florian [Abstract] [Full Text]; Wagner, Florian M. [Abstract] [Full Text]; Watanabe, Masazumi [Abstract] [Full Text]; Wendel, Hans P. [Abstract] [Full Text]; Weng, Yu Guo [Abstract] [Full Text]; Wiest, Donald B. [Abstract] [Full Text]
X: Xiang, Bo [Abstract] [Full Text]
Y: Yamazato, Ario [Full Text]; Yankelevitz, David [Abstract] [Full Text]; Yoshida, Yuki [Full Text]; Yoshimura, Masahiro [Abstract] [Full Text]; Yoshizu, Hiroshi [Abstract] [Full Text]; Young, James B. [Abstract] [Full Text]
Z: Zerkowski, H. R. [Abstract] [Full Text]; Zhezong, Luo [Abstract] [Full Text]; Ziegler, James W. [Abstract] [Full Text]; Ziemer, Gerhard [Abstract] [Full Text]; Zimarino, Marco [Abstract] [Full Text]