JTCS -- Index by Author (Jan 2000; 119, Number 1)

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Index by Author: Jan 2000; 119 (1) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Albayrak, Mustafa [Full Text]; Alper, Aysin [Full Text]; Alvarez, John M. [Full Text]; Amano, Jun [Abstract] [Full Text]; Angelini, Gianni D. [Abstract] [Full Text]; Antunes, Michael J. [Full Text]; Ariano, Robert E. [Full Text]; Armstrong, Susan [Abstract] [Full Text]; Asamura, Hisao [Full Text]; Ascione, Raimondo [Abstract] [Full Text]
B: Börner, Angelika [Abstract] [Full Text]; Bacha, Emile A. [Full Text]; Baskett, Roger J. F. [Full Text]; Berger, Anja [Abstract] [Full Text]; Bhatnagar, Narendra K. [Abstract] [Full Text]; Bhattacharya, Samir K. [Full Text]; Black, Andrew [Abstract] [Full Text]; Bojar, Robert M. [Abstract] [Full Text]; Bouchardy, Christine [Abstract] [Full Text]; Boyle, Kathleen [Abstract] [Full Text]; Bozkurt, Durmus [Full Text]; Braunberger, E. [Abstract] [Full Text]; Bregman, David [Full Text]; Brooks, James Patrick [Full Text]; Brown, Stuart [Abstract] [Full Text]; Brownell, Laurence G. [Full Text]; Bruneval, P. [Abstract] [Full Text]; Bueno, Raphael [Abstract] [Full Text]; Bukhari, Emad [Full Text]; Burns, Robert J. [Abstract] [Full Text]
C: Çetin, Güven [Full Text]; Carpentier, A. [Abstract] [Full Text]; Carpino, Phillip A. [Abstract] [Full Text]; Chamberlain, Martin H. [Full Text]; Chambers, Charles E. [Abstract] [Full Text]; Choh, Shinsuke [Abstract] [Full Text]; Cooper, Joel D. [Abstract] [Full Text]; Cusimano, Robert J. [Abstract] [Full Text]
D: Damiano, Ralph J. [Abstract] [Full Text]; Dargaville, Peter Anderson [Full Text]; David, Tirone E. [Abstract] [Full Text]; Davis, Deborah A. [Full Text]; de Perrot, Marc [Abstract] [Full Text]; del Nido, Pedro J. [Full Text]; Deufel, Thomas [Abstract] [Full Text]; Donovan, Carolyn [Abstract] [Full Text]; Ducko, Christopher T. [Abstract] [Full Text]
E: Ehrman, Walter J. [Abstract] [Full Text]; El-Ghoneimi, Yasser A. Farag [Abstract] [Full Text]; Ellis, Jeffrey T. [Abstract] [Full Text]; Essner, Richard [Abstract] [Full Text]; Estrera, Aaron S. [Full Text]
F: Fabiani, J. N. [Abstract] [Full Text]; Fagan, Gregory P. [Abstract] [Full Text]; Fraser, Charles D. [Full Text]; Fuhlbrigge, Anne [Abstract] [Full Text]
G: Gardner, Freda [Abstract] [Full Text]; Georgiadis, Dimitrios [Abstract] [Full Text]; Glotz, D. [Abstract] [Full Text]; Greenspan, Jay S. [Full Text]
H: Hall, Timothy S. [Abstract] [Full Text]; Halligan, Peter W. [Abstract] [Full Text]; Hama, Yoshiyuki [Abstract] [Full Text]; Hammon, John W. [Full Text]; Hanley, Frank L. [Full Text]; Hata, Mitsumasa [Abstract] [Full Text]; Hata, Hiroaki [Abstract] [Full Text]; He, Guo-Wei [Abstract] [Full Text]; Hida, Yasunori [Full Text]; Hill, Jonathan [Full Text]; Holmgren, Daniel [Abstract] [Full Text]; Hong, James [Abstract] [Full Text]; Hoon, Dave S. B. [Abstract] [Full Text]; Hori, Goichi [Full Text]; Hsia, Connie C. W. [Full Text]; Husain, Ali [Full Text]; Husain, Mansoor [Abstract] [Full Text]; Huynh, Young [Abstract] [Full Text]
I: Ingenito, Edward P. [Abstract] [Full Text]; Isobe, Mitsuaki [Abstract] [Full Text]; Ivanov, Joan [Abstract] [Full Text]; Iwanochko, Mark [Abstract] [Full Text]
J: Jaklitsch, Michael T. [Abstract] [Full Text]; James, Edward A. [Full Text]; Jaramillo, Andrés [Abstract] [Full Text]; Jarvis, William R. [Abstract] [Full Text]; Jia, Zhi-Qiang [Abstract] [Full Text]; Jonas, Richard A. [Full Text]; Jones, Kevin C. [Abstract] [Full Text]
K: Kadoi, Yuji [Full Text]; Kadoi, Yuji [Full Text]; Kamio, Yoshito [Full Text]; Kashiwazaki, Satoshi [Abstract] [Full Text]; Katsumata, Takahiro [Abstract] [Full Text]; Khabbaz, Kamal R. [Abstract] [Full Text]; Kim, Eung-Joong [Abstract] [Full Text]; Kimmel, Wendy A. [Full Text]; Kimura, Shun-ichi [Abstract] [Full Text]; Kingsley, Charles P. [Abstract] [Full Text]; Kitahara, Hiroto [Abstract] [Full Text]; Kitami, Akihiko [Full Text]; Klatzmann, D. [Abstract] [Full Text]; Kobzik, Lester [Abstract] [Full Text]; Koide, Naohiko [Abstract] [Full Text]; Kono, Tetsuya [Abstract] [Full Text]; Kowatschev, Ellen [Abstract] [Full Text]; Kutlu, Cemal Asim [Full Text]
L: Laussen, Peter C. [Abstract] [Full Text]; Lautenschläger, Christine [Abstract] [Full Text]; Li, Ren-Ke [Abstract] [Full Text]; Licker, Marc [Abstract] [Full Text]; Liman, Tuba [Full Text]; Lindner, Alfred [Abstract] [Full Text]; Lloyd, Clinton T. [Abstract] [Full Text]; Lukanich, Jeanne M. [Abstract] [Full Text]
M: Margolis, David S. [Full Text]; Mayer, John E. [Full Text]; McKee, Charlotte [Abstract] [Full Text]; Mentzer, Steve J. [Abstract] [Full Text]; Metin, Muzaffer [Full Text]; Mickle, Donald A. G. [Abstract] [Full Text]; Millar, Kenneth John [Full Text]; Mohanakumar, T. [Abstract] [Full Text]; Moon, Michael [Full Text]; Morton, Donald L. [Abstract] [Full Text]; Munoz, Ricardo [Abstract] [Full Text]; Murphy, Richard E. [Abstract] [Full Text]
N: Nadolny, Edward [Full Text]; Nakano, Hirohumi [Abstract] [Full Text]; Negishi, Nanao [Abstract] [Full Text]; Nguyen, Tung [Abstract] [Full Text]; Nimer, Khalid Al [Full Text]
O: Özdülger, Ali [Full Text]; Oakley, Reida El [Full Text]; Okumura, Haruhiko [Abstract] [Full Text]; Orime, Yukihiko [Abstract] [Full Text]
P: Palacio, Guillermo [Abstract] [Full Text]; Patterson, G. Alexander [Abstract] [Full Text]; Paul, David A. [Full Text]; Payne, Douglas D. [Abstract] [Full Text]; Penney, Dana L. [Full Text]; Perry, Stanton [Full Text]; Piercey, Gary [Abstract] [Full Text]; Prêtre, René [Full Text]; Prentice, Michael B. [Full Text]
R: Rastegar, Hassan [Abstract] [Full Text]; Ratcliffe, Mark B. [Abstract] [Full Text]; Raynal-Raschilas, N. [Abstract] [Full Text]; Reilly, John J. [Abstract] [Full Text]; Reppen, Mel L. [Abstract] [Full Text]; Reznik, Scott I. [Abstract] [Full Text]; Robert, John [Abstract] [Full Text]; Ross, David B. [Full Text]; Ruch, Stuart [Abstract] [Full Text]; Russo, Pierantonio [Full Text]
S: Südow, Göran [Abstract] [Full Text]; Saatvedt, Kjell [Abstract] [Full Text]; Sader, Albert Amin [Full Text]; Saito, Shigeru [Full Text]; Saito, Shigeru [Full Text]; Sakai, Tetsuro [Abstract] [Full Text]; Salahieh, Ali [Abstract] [Full Text]; Sayar, Adnan [Full Text]; Scheckler, William E. [Abstract] [Full Text]; Schulte-Mattler, Wilhelm [Abstract] [Full Text]; Schwartz, Leonard [Abstract] [Full Text]; Sezai, Akira [Abstract] [Full Text]; Sezai, Yukiyasu [Abstract] [Full Text]; Shahian, David M. [Full Text]; Shiono, Motomi [Abstract] [Full Text]; Smith, Ellen M. [Abstract] [Full Text]; Solymar, Laszlo [Abstract] [Full Text]; South, Michael [Full Text]; Spiliopoulos, Anastase [Abstract] [Full Text]; Stephenson, Edward R. [Abstract] [Full Text]; Stump, David [Full Text]; Sugarbaker, David J. [Abstract] [Full Text]; Suzuki, Jun-ichi [Abstract] [Full Text]; Suzuki, Takashi [Full Text]; Suzuki, Shuichi [Full Text]; Svensson, Lars G. [Full Text]; Swanson, Ronald A. [Full Text]; Swanson, Scott J. [Abstract] [Full Text]
T: Tabaie, Harold A. [Abstract] [Full Text]; Taggart, David P. [Full Text]; Takeda, Shin-ichi [Full Text]; Tastepe, Irfan [Full Text]; Thomas-Vaslin, V. [Abstract] [Full Text]; Tokars, Jerome I. [Abstract] [Full Text]; Tomita, Shinji [Abstract] [Full Text]; Topçu, Salih [Full Text]; Trick, William E. [Abstract] [Full Text]; Tripp, Henry F. [Full Text]; Turina, Marko I. [Full Text]
U: Ündar, Akif [Full Text]; Underwood, Malcolm J. [Abstract] [Full Text]; Uppal, Rakesh [Full Text]; Usel, Massimo [Abstract] [Full Text]
V: van Oeveren, Willem [Abstract] [Full Text]
W: Wallace, Arthur W. [Abstract] [Full Text]; Warner, Kenneth G. [Abstract] [Full Text]; Weisel, Richard D. [Abstract] [Full Text]; Wessel, David L. [Abstract] [Full Text]; Westaby, Stephen [Abstract] [Full Text]; White, Samantha [Abstract] [Full Text]
Y: Yagi, Shinya [Abstract] [Full Text]; Yamamoto, Tomonori [Abstract] [Full Text]; Yang, Cheng-Qin [Abstract] [Full Text]; Yau, Terrence M. [Abstract] [Full Text]; Yau, Terrence M. [Abstract] [Full Text]; Yoganathan, Ajit P. [Abstract] [Full Text]; Yokoyama, Eise [Abstract] [Full Text]
Z: Zerkowski, Hans-Reinhard [Abstract] [Full Text]; Zhang, Leiying [Abstract] [Full Text]; Zienko, Lynne [Abstract] [Full Text]; Zierz, Stephan [Abstract] [Full Text]