JTCS -- Index by Author (Mar 2000; 119, Number 3)

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Index by Author: Mar 2000; 119 (3) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Akindipe, Olufemi [Abstract] [Full Text]; Alessandrini, Francesco [Abstract] [Full Text]; Allen, Keith B. [Abstract] [Full Text]; Ancona, Ermanno [Abstract] [Full Text]; Arusoglu, L. [Abstract] [Full Text]; Arusoglu, L. [Abstract] [Full Text]; Auden, Steve M. [Full Text]; Austin, Erle H. [Full Text]; Aziz, Salim [Abstract] [Full Text]
B: Bains, Manjit [Abstract] [Full Text]; Barankay, Andreas [Abstract] [Full Text]; Barlow, Clifford W. [Abstract] [Full Text]; Becker, Bernhard F. [Abstract] [Full Text]; Belanger, Michael P. [Abstract] [Full Text]; Black, Michael D. [Abstract] [Full Text]; Bohnet, Ulrich [Abstract] [Full Text]; Boutin, Christine [Abstract] [Full Text]; Braun, Siegmund L. [Abstract] [Full Text]; Bunn, P. A. [Abstract] [Full Text]; Bush, Andrew [Abstract] [Full Text]
C: Cagol, Matteo [Abstract] [Full Text]; Campbell, D. N. [Abstract] [Full Text]; Campbell, David B. [Full Text]; Carson, Susan [Abstract] [Full Text]; Cavaliere, Franco [Abstract] [Full Text]; Cecchin, Frank [Abstract] [Full Text]; Cheng, Tsung O. [Full Text]; Chetham, P. [Abstract] [Full Text]; Chocron, Sidney [Abstract] [Full Text]; Christian, Karla R. [Abstract] [Full Text]; Clement, François [Abstract] [Full Text]; Coles, John G. [Abstract] [Full Text]; Cornel, Garry [Full Text]; Cornel, Garry [Full Text]; Crowley, J. J. [Abstract] [Full Text]
D: De Bonis, Michele [Abstract] [Full Text]; Deeb, Maher [Full Text]; del Nido, Pedro J. [Abstract] [Full Text]; DelRossi, Anthony J. [Abstract] [Full Text]; Dowling, Robert D. [Abstract] [Full Text]; Downey, Robert J. [Abstract] [Full Text]; Drinkwater, Davis [Abstract] [Full Text]; Duncan, Brian W. [Abstract] [Full Text]
E: Edelman, Jeffrey D. [Full Text]; El-Banayosy, A. [Abstract] [Full Text]; El-Banayosy, A. [Abstract] [Full Text]; Ermert, Leander [Abstract] [Full Text]; Etievent, Joseph-Philippe [Abstract] [Full Text]; Evora, Paulo Roberto B. [Full Text]
F: Fearneyhough, Collette [Abstract] [Full Text]; Ferguson, Mark K. [Abstract] [Full Text]; Fey, O. [Abstract] [Full Text]; Fischer, Stefan [Abstract] [Full Text]; Fogelson, Bernard G. [Abstract] [Full Text]; Freyholdt, Tobias [Abstract] [Full Text]; Fudge, Tommy L. [Abstract] [Full Text]
G: Gangemi, James J. [Abstract] [Full Text]; Ginsberg, Robert [Abstract] [Full Text]; Ginsberg, R. J. [Abstract] [Full Text]; Giroux, D. J. [Abstract] [Full Text]; Grifka, Ronald G. [Abstract] [Full Text]; Grimm, Helmut [Abstract] [Full Text]; Grover, F. L. [Abstract] [Full Text]
H: Hanley, Frank L. [Full Text]; Hennein, Hani A [Full Text]; Henze, Richard [Abstract] [Full Text]; Hodges, T. N. [Abstract] [Full Text]; Hopkinson, David [Abstract] [Full Text]; Hsu, F. Ida [Abstract] [Full Text]; Huerd, S. Scott [Abstract] [Full Text]
I: Iguro, Yoshifumi [Full Text]; Inoue, K. [Abstract] [Full Text]; Ivanov, Joan [Abstract] [Full Text]
J: Jahangiri, Marjan [Full Text]; Jahangiri, Marjan [Abstract] [Full Text]; Jeppsson, Anders [Abstract] [Full Text]; Johnson, D. H. [Abstract] [Full Text]; Jonas, Richard A. [Abstract] [Full Text]; Jones, Thomas K. [Abstract] [Full Text]
K: Körfer, R. [Abstract] [Full Text]; Körfer, R. [Abstract] [Full Text]; Körner, M. M. [Abstract] [Full Text]; Kaili, Djamel [Abstract] [Full Text]; Kaiser, Larry [Full Text]; Karrison, Theodore [Abstract] [Full Text]; Kazui, Teruhisa [Abstract] [Full Text]; Keenan, Heather T. [Abstract] [Full Text]; Keogh, Brian [Full Text]; Kern, John A. [Abstract] [Full Text]; Keshavjee, Shaf [Abstract] [Full Text]; Kizner, L. [Abstract] [Full Text]; Kizner, L. [Abstract] [Full Text]; Kneebone, James M. [Abstract] [Full Text]; Korom, Stephan [Abstract] [Full Text]; Korst, Robert [Abstract] [Full Text]; Kris, M. G. [Abstract] [Full Text]; Kron, Irving L. [Abstract] [Full Text]
L: Lapenna, Elisabetta [Abstract] [Full Text]; Latini, Leonardo [Abstract] [Full Text]; Law, William R. [Abstract] [Full Text]; Lefrak, Edward A. [Abstract] [Full Text]; Leon, Larry [Abstract] [Full Text]; Li, Jia [Abstract] [Full Text]; Lincoln, Christopher [Full Text]; Lincoln, Christopher [Abstract] [Full Text]; Lindemann, Gertraut [Abstract] [Full Text]; Linehan, David [Abstract] [Full Text]; Liu, Mingyao [Abstract] [Full Text]; Lupinetti, Flavian M. [Abstract] [Full Text]; Lupinetti, Flavian M. [Abstract] [Full Text]
M: Mages, Petra [Abstract] [Full Text]; Massoudy, Parwis [Abstract] [Full Text]; Mault, J. R. [Abstract] [Full Text]; Mault, J. [Abstract] [Full Text]; Mayer, John E. [Abstract] [Full Text]; McGregor, Christopher G. A. [Abstract] [Full Text]; Meisner, Hans [Abstract] [Full Text]; Merigliano, Stefano [Abstract] [Full Text]; Merrill, Walter [Abstract] [Full Text]; Mickleborough, Lynda L. [Abstract] [Full Text]; Miller, Virginia M. [Abstract] [Full Text]; Minami, K. [Abstract] [Full Text]; Minami, K. [Abstract] [Full Text]; Mitchell, M. B. [Abstract] [Full Text]; Miyamoto, Koho-J. [Full Text]; Miyamoto, Tadaomi-A. [Full Text]; Molena, Daniela [Abstract] [Full Text]; Moon, Marc R. [Abstract] [Full Text]; Moriyama, Yukinori [Full Text]; Morshuis, M. [Abstract] [Full Text]; Moscato, Umberto [Abstract] [Full Text]; Mostovych, Mark [Abstract] [Full Text]; Muhammad, Bashar Abul Hasan [Abstract] [Full Text]
N: Najm, Hani K. [Abstract] [Full Text]; Nawas, Sammy I. [Abstract] [Full Text]
O: O’Brien, Timothy [Abstract] [Full Text]; Owens, David J. [Abstract] [Full Text]
P: Patterson, G. Alexander [Full Text]; Pellegrini, Carlo [Abstract] [Full Text]; Penny, Daniel J. [Abstract] [Full Text]; Pfeffer, Thomas A. [Abstract] [Full Text]; Pisters, K. M.W. [Abstract] [Full Text]; Posival, H. [Abstract] [Full Text]; Possati, Gian Federico [Abstract] [Full Text]; Potthoff, Mechthild [Abstract] [Full Text]; Putnam, J. B. [Abstract] [Full Text]
R: Ramamoorthy, Chandra [Abstract] [Full Text]; Realyvasques, Fidel [Abstract] [Full Text]; Redington, Andrew N. [Abstract] [Full Text]; Reitz, Bruce A. [Abstract] [Full Text]; Robbins, Robert C. [Abstract] [Full Text]; Roberts, John R. [Abstract] [Full Text]; Roberts, J. R. [Abstract] [Full Text]; Rodriguez, Rosendo A. [Full Text]; Rodriguez, Rosendo A. [Full Text]; Rosenthal, Geoffrey L. [Abstract] [Full Text]; Ross, Scott D. [Abstract] [Full Text]; Ruol, Alberto [Abstract] [Full Text]; Rusch, Valerie [Abstract] [Full Text]
S: Santarelli, Filippo [Abstract] [Full Text]; Sarsam, Mazin A. I. [Full Text]; Scallan, Michael [Abstract] [Full Text]; Scappin, Sabrina [Abstract] [Full Text]; Schütt, U. [Abstract] [Full Text]; Schiavello, Rocco [Abstract] [Full Text]; Schuch, Douglas [Abstract] [Full Text]; Schulze-Neick, Ingram [Abstract] [Full Text]; Shaar, Carl J. [Abstract] [Full Text]; Shinebourne, Elliot A. [Full Text]; Shockey, Kimberly S. [Abstract] [Full Text]; Shore, Darryl [Abstract] [Full Text]; Shrager, Joseph B. [Full Text]; Shyr, Yu [Abstract] [Full Text]; Souba, Wiley W. [Full Text]; St Laurent, Char R. [Abstract] [Full Text]; Starnes, Sandra L. [Abstract] [Full Text]; Stephens, Kenton E. [Abstract] [Full Text]; Szentpetery, Szabolc [Abstract] [Full Text]
T: Takinami, Makoto [Abstract] [Full Text]; Tamariz, Miguel [Abstract] [Full Text]; Tamiya, Yukihiko [Abstract] [Full Text]; Taner, C. Burcin [Abstract] [Full Text]; Tazelaar, Henry D. [Abstract] [Full Text]; Tenderich, G. [Abstract] [Full Text]; Terada, Hitoshi [Abstract] [Full Text]; Theodore, James [Abstract] [Full Text]; Thiagarajan, Ravi [Abstract] [Full Text]; Torres, F. [Abstract] [Full Text]; Toubin, Gérard [Abstract] [Full Text]; Tribble, Curtis G. [Abstract] [Full Text]
U: Urschel, Harold C. [Full Text]
V: Van Arsdell, Glen S. [Abstract] [Full Text]; van Zee, Kimberly [Abstract] [Full Text]; Venkatraman, Ennapadam [Abstract] [Full Text]; Venuta, Federico [Full Text]; Viel, Jean-Francois [Abstract] [Full Text]
W: Waldhausen, John A. [Full Text]; Waldhausen, John A. [Full Text]; Wallen, W. Jack [Abstract] [Full Text]; Washiyama, Naoki [Abstract] [Full Text]; Watanabe, Shunichi [Full Text]; Weerasena, Nihal A. [Full Text]; Weerasena, Nihal A. [Full Text]; Williams, William G. [Abstract] [Full Text]; Williams, Glyn [Abstract] [Full Text]; Wittnich, Carin [Abstract] [Full Text]
Y: Yamamoto, Hiroyuki [Full Text]; Yamashita, Katsushi [Abstract] [Full Text]; Yan, Yusheng [Abstract] [Full Text]; Yiu, Patrick [Full Text]; Yotsumoto, Goichi [Full Text]
Z: Zahler, Stefan [Abstract] [Full Text]; Zamora, M. R. [Abstract] [Full Text]; Zaninotto, Giovanni [Abstract] [Full Text]; Zurakowski, David [Abstract] [Full Text]