JTCS -- Index by Author (Oct 2000; 120, Number 4)

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	Author:		Keyword(s):
Year:		Vol:		Page:

Index by Author: Oct 2000; 120 (4) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Adachi, Hideo [Full Text]; Alexiou, Christos [Full Text]; Allevard, Anne-Marie [Abstract] [Full Text]; Amar, David [Abstract] [Full Text]; Anderson, Todd J. [Abstract] [Full Text]; Ando, Kiyoshi [Abstract] [Full Text]; Anzibar, Rafael [Full Text]; Artounian, Vazgen R. [Full Text]
B: Bacha, Emile [Abstract] [Full Text]; Bacha, Emile [Abstract] [Full Text]; Bailey, Michael [Abstract] [Full Text]; Bains, Manjit S. [Abstract] [Full Text]; Ballester, Rosa María [Abstract] [Full Text]; Bauer, Erwin P. [Abstract] [Full Text]; Blackstone, Eugene H. [Full Text]; Boyd, W. Douglas [Full Text]; Brozena, Susan C. [Abstract] [Full Text]; Bryan, Patricia [Abstract] [Full Text]; Buckberg, Gerald D. [Full Text]
C: Champsaur, Gérard [Abstract] [Full Text]; Chang, Ya Ju [Full Text]; Chua, Yeow Leng [Abstract] [Full Text]; Cichon, Romuald [Full Text]; Crisci, Clemente [Full Text]; Cruz Guadrón, Eduardo A. [Full Text]
D: Damiano, Ralph J. [Abstract] [Full Text]; Damiano, Ralph J. [Full Text]; DeCampli, William M. [Full Text]; del Nido, Pedro J. [Abstract] [Full Text]; Delany, David J. [Full Text]; Desai, Nimesh D. [Full Text]; Diephuis, Jan C. [Abstract] [Full Text]; Dipp, Michelle [Full Text]; Discigil, Berent [Abstract] [Full Text]; Dobkowski, Wojciech [Full Text]; Downey, Robert J. [Abstract] [Full Text]; Dumont, Aaron S. [Abstract] [Full Text]; Durand, Catelijne [Abstract] [Full Text]
E: Evora, Paulo R. B. [Abstract] [Full Text]
F: Fallon, John T. [Full Text]; Franck, Michel [Abstract] [Full Text]; Friehs, Ingeborg [Abstract] [Full Text]; Fujimura, Shigefumi [Abstract] [Full Text]; Furukawa, Tsugio [Abstract] [Full Text]
G: Ganapathy, Sugantha [Full Text]; Ginsberg, Robert J. [Abstract] [Full Text]; Ginsburg, Ilana [Abstract] [Full Text]; Glenville, Brian [Full Text]; Gong, Geoffrey G. [Abstract] [Full Text]; Gulielmos, Vassilios [Full Text]
H: Hasegawa, Tomomi [Abstract] [Full Text]; Hattan, Naoichiro [Abstract] [Full Text]; Headrick, J. Robert [Abstract] [Full Text]; Hijman, Ron [Abstract] [Full Text]; Hirotani, Takashi [Abstract] [Full Text]; Hisatomi, Kouichi [Abstract] [Full Text]; Hisatomi, Kouichi [Abstract] [Full Text]; Hoenicke, Eric M. [Abstract] [Full Text]; Hogan, Patrick [Full Text]
I: Ichinose, Yukito [Abstract] [Full Text]; Iguro, Yoshifumi [Abstract] [Full Text]; Iguro, Yoshifumi [Abstract] [Full Text]; Ino, Takashi [Full Text]; Inoue, Yoichi [Full Text]; Ishii, Osamu [Abstract] [Full Text]; Izrailtyan, Igor [Abstract] [Full Text]; Izutani, Hironori [Full Text]
J: Jablonsky, George [Full Text]; Jahangiri, Marjan [Abstract] [Full Text]; Jonas, Richard A. [Abstract] [Full Text]; Jonas, Richard A. [Abstract] [Full Text]
K: Kameda, Tadashi [Abstract] [Full Text]; Kappert, Utz [Full Text]; Keeton, Barry R. [Full Text]; Keizer, Annemieke M. A. [Abstract] [Full Text]; Kerr, Leslie Dubin [Full Text]; Kiaii, Bob [Full Text]; Kieser, Teresa M. [Abstract] [Full Text]; Klövekorn, Wolf P. [Abstract] [Full Text]; Kobayashi, Yasuyuki [Full Text]; Korst, Robert J. [Abstract] [Full Text]; Kouchoukos, Nicholas T. [Full Text]; Kraus, Bernhard [Abstract] [Full Text]; Kresh, J. Yasha [Abstract] [Full Text]; Kreutzer, Jacqueline [Abstract] [Full Text]; Kumamoto, Takayuki [Abstract] [Full Text]; Kutalek, Steven P. [Abstract] [Full Text]
L: Légaré, Jean-Francois [Abstract] [Full Text]; Law, William R. [Full Text]; Lee, Timothy D. G. [Abstract] [Full Text]; Lehot, Jean Jacques [Abstract] [Full Text]; Leone, Ruben W. [Full Text]; Leung, Denis H. Y. [Abstract] [Full Text]; Lluch, Salvador [Abstract] [Full Text]; Lluch, Paloma [Abstract] [Full Text]; Lovren, Fina [Abstract] [Full Text]
M: Macleod, Ken [Full Text]; Maitland, Andrew [Abstract] [Full Text]; Mariani, Justin [Abstract] [Full Text]; Martínez-León, Juan Bautista [Abstract] [Full Text]; Martinot, Stéphane [Abstract] [Full Text]; Masetti, Paolo [Full Text]; Massimo, Carlo G. [Full Text]; Masuda, Hiroshi [Abstract] [Full Text]; Masuda, Hiroshi [Abstract] [Full Text]; Mather, Kieren J. [Abstract] [Full Text]; Matschke, Klaus [Full Text]; Matsumoto, Hitoshi [Abstract] [Full Text]; Matsumoto, Hitoshi [Abstract] [Full Text]; Matsuura, Yuichiro [Abstract] [Full Text]; Mayer, John E. [Abstract] [Full Text]; McKenzie, F. Neil [Full Text]; Medina, Pascual [Abstract] [Full Text]; Menkis, Alan H. [Full Text]; Miyamoto, Tadaomi-Alfonso [Full Text]; Miyamoto, Koho-Julio [Full Text]; Mohammed, Minhaz U. [Abstract] [Full Text]; Monro, James L. [Full Text]; Moran, Adrian M. [Abstract] [Full Text]; Mori, Takashi [Abstract] [Full Text]; Mori, Hidezo [Abstract] [Full Text]; Moriyama, Yukinori [Abstract] [Full Text]; Moriyama, Yukinori [Abstract] [Full Text]; Morris, Rohinton J. [Abstract] [Full Text]; Murakami, Arata [Abstract] [Full Text]; Murakawa, Tomohiro [Abstract] [Full Text]; Mussa, Shafi [Full Text]
N: Nagai, Kanji [Abstract] [Full Text]; Nagley, Phillip [Abstract] [Full Text]; Nakagawa, Ken [Abstract] [Full Text]; Nakajima, Jun [Abstract] [Full Text]; Nanton, Maurice A. [Abstract] [Full Text]; Novick, Richard J. [Full Text]; Nozar, José V. [Full Text]; Nye, Piers C. G. [Full Text]
O: O'Brien, Mark [Full Text]; Ohata, Toshihiro [Full Text]; Oka, Shigeteru [Abstract] [Full Text]; Okada, Kenji [Abstract] [Full Text]; Ono, Minoru [Abstract] [Full Text]; Ootaki, Yoshio [Abstract] [Full Text]; Orihashi, Kazumasa [Abstract] [Full Text]; Oshima, Yoshihiro [Abstract] [Full Text]; Ou, Ruchong [Abstract] [Full Text]
P: Pearson, Paul J. [Abstract] [Full Text]; Pepe, Salvatore [Abstract] [Full Text]; Picarelli, Dante [Full Text]
R: Rappa, Hugh G. [Full Text]; Rayman, Reiza [Full Text]; Reuthebuch, Oliver [Abstract] [Full Text]; Robicsek, Francis [Abstract] [Full Text]; Robin, Jacques [Abstract] [Full Text]; Roistacher, Nancy [Abstract] [Full Text]; Rose, Eric A. [Full Text]; Rosenfeldt, Franklin [Abstract] [Full Text]; Ross, David B. [Abstract] [Full Text]; Roth, Matthias [Abstract] [Full Text]; Rowland, Michael [Abstract] [Full Text]; Roy, Amit [Full Text]; Rusch, Valerie W. [Abstract] [Full Text]
S: Sakakibara, Tetsuo [Full Text]; Schaff, Hartzell V. [Abstract] [Full Text]; Scheffold, Thomas [Abstract] [Full Text]; Schneider, Jens [Full Text]; Scholar, Miles [Full Text]; Schramm, Ina [Full Text]; Schueler, Stephan [Full Text]; Segarra, Gloria [Abstract] [Full Text]; Shimazu, Chikashi [Abstract] [Full Text]; Shimokawa, Shinji [Abstract] [Full Text]; Shimokawa, Shinji [Abstract] [Full Text]; Shirota, Shogo [Abstract] [Full Text]; Sinha, Avinash [Full Text]; Spiera, Harry [Full Text]; Stamm, Christof [Abstract] [Full Text]; Strange, Robert G. [Abstract] [Full Text]; Sueda, Taijiro [Abstract] [Full Text]; Suematsu, Yoshihiro [Abstract] [Full Text]; Sugawara, Yuji [Abstract] [Full Text]; Sugio, Yoshinori [Abstract] [Full Text]; Sun, Xiwu [Abstract] [Full Text]
T: Taggart, David P. [Abstract] [Full Text]; Taggart, David P. [Full Text]; Taira, Akira [Abstract] [Full Text]; Taira, Akira [Abstract] [Full Text]; Takamoto, Shinichi [Abstract] [Full Text]; Takano, Hiroshi [Full Text]; Tambasco, Jorge [Full Text]; Tanaka, Etsuro [Abstract] [Full Text]; Thubrikar, Mano J. [Abstract] [Full Text]; Toda, Riichiro [Abstract] [Full Text]; Toda, Riichiro [Abstract] [Full Text]; Triggle, Christopher R. [Abstract] [Full Text]; Tronc, François [Abstract] [Full Text]; Tsuchiya, Ryosuke [Abstract] [Full Text]; Tugtekin, Sems M. [Full Text]
U: Ueno, Hikaru [Abstract] [Full Text]
V: van Dijk, Diederik [Abstract] [Full Text]; Vedrinne, Catherine [Abstract] [Full Text]; Verma, Subodh [Abstract] [Full Text]; Vila, José María [Abstract] [Full Text]; Vincent, Madeleine [Abstract] [Full Text]; Voltchikhina, Svetlana A. [Abstract] [Full Text]; Vos, Liesbeth J. [Abstract] [Full Text]
W: Wang, Zhong-Gao [Full Text]; Watanabe, Shun-ichi [Abstract] [Full Text]; Watanabe, Shun-ichi [Abstract] [Full Text]; Watari, Masanobu [Abstract] [Full Text]; Wechsler, Andrew S. [Abstract] [Full Text]
Y: Yamaguchi, Masahiro [Abstract] [Full Text]; Yamaguchi, Atsushi [Full Text]; Yokoi, Kohei [Abstract] [Full Text]; Yoshimura, Naoki [Abstract] [Full Text]
Z: Zehr, Kenton J. [Abstract] [Full Text]; Zhang, Hao [Abstract] [Full Text]; Zurakowski, David [Abstract] [Full Text]; Zurakowski, David [Abstract] [Full Text]