JTCS -- Index by Author (121 [1])

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Year:		Vol:		Page:

Index by Author: Jan 2001; 121 (1) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Akpinar, Belhhan [Full Text]; Aksoy, Nazan [Full Text]; Athanasuleas, Constantine [Abstract] [Full Text]
B: Bayindir, Osman [Full Text]; Bengtsson, Lars [Abstract] [Full Text]; Bennink, Ger B. W. E. [Full Text]; Blackstone, Eugene H. [Abstract] [Full Text]; Borger, Michael A. [Abstract] [Full Text]; Breathnach, O. S. [Abstract] [Full Text]; Buckberg, Gerald [Abstract] [Full Text]; Butterworth, John [Abstract] [Full Text]
C: Chapelier, Alain [Abstract] [Full Text]; Cohen, Gideon [Abstract] [Full Text]; Cornel, Garry [Abstract] [Full Text]; Cosgrove, Delos M. [Full Text]
D: Dahm, Manfred [Abstract] [Full Text]; Dartevelle, Philippe [Abstract] [Full Text]; Davis, Bryan M. [Abstract] [Full Text]; de Vries, Jaap W. [Full Text]; del Nido, Pedro J. [Abstract] [Full Text]; Di Donato, Marisa [Abstract] [Full Text]; Dor, Vincent [Abstract] [Full Text]
F: Fadel, Elie [Abstract] [Full Text]; Fang, Bingliang [Abstract] [Full Text]; Feindel, Christopher M. [Abstract] [Full Text]; Feneley, Michael P. [Abstract] [Full Text]; Finkelstein, D. M. [Abstract] [Full Text]; Floh, Alejandro A. [Abstract] [Full Text]; Friehs, Ingeborg [Abstract] [Full Text]
G: Güden, Mustafa [Full Text]; Güney, Mehmet Rasit [Full Text]; Garfein, Evan S. [Abstract] [Full Text]; Gaumann, Andreas [Abstract] [Full Text]; Gensini, Gian Franco [Abstract] [Full Text]; Ginsberg, Mark E. [Abstract] [Full Text]; Godleski, J. [Abstract] [Full Text]; Gorenstein, Lyall [Abstract] [Full Text]
H: Haegerstrand, Anders [Abstract] [Full Text]; Hake, Ulrich [Abstract] [Full Text]; Hammon, John W. [Abstract] [Full Text]; Hattori, Reiji [Abstract] [Full Text]
I: Ikeda, Yoshifumi [Full Text]; Imamura, Hiroji [Abstract] [Full Text]; Ishii, Osamu [Full Text]; Ishimori, Shotaro [Full Text]
J: James, Robert L. [Abstract] [Full Text]; Jansson, Katarina [Abstract] [Full Text]; Johnson, B. E. [Abstract] [Full Text]; Jonas, Richard A. [Abstract] [Full Text]; Jonas, Richard A. [Abstract] [Full Text]
K: Karunanithi, Mohanraj K. [Abstract] [Full Text]; Kauczor, Hans Ulrich [Abstract] [Full Text]; Kevelaitis, Egidijus [Abstract] [Full Text]; Kodaira, Susumu [Full Text]; Kriegsmann, Jörg [Abstract] [Full Text]; Kwiatkowski, D. J. [Abstract] [Full Text]
L: Li, Ren-Ke [Abstract] [Full Text]; Lock, James E. [Abstract] [Full Text]; Lofland, Gary K. [Abstract] [Full Text]; Lu, Kejie [Abstract] [Full Text]
M: Macchiarini, Paolo [Abstract] [Full Text]; Maioli, Mauro [Abstract] [Full Text]; Mayer, John E. [Abstract] [Full Text]; Mayer, Eckhard [Abstract] [Full Text]; McCrindle, Brian W. [Abstract] [Full Text]; McDonnell, Tim [Abstract] [Full Text]; McGregor, Carlton C. [Abstract] [Full Text]; Menasché, Philippe [Abstract] [Full Text]; Mentzer, S. [Abstract] [Full Text]; Michniewicz, Jerzy [Abstract] [Full Text]; Mickle, Donald A. G. [Abstract] [Full Text]; Mickleborough, Lynda L. [Full Text]; Mickleborough, Lynda L. [Abstract] [Full Text]; Moran, Adrian M. [Abstract] [Full Text]; Mouas, Christian [Abstract] [Full Text]
N: Nakao, Yoshihisa [Abstract] [Full Text]; Neville, Michael J. [Abstract] [Full Text]; Niimi, Masanori [Full Text]; Ninomiya, Hideki [Abstract] [Full Text]
O: Oelert, Hellmut [Abstract] [Full Text]; Okada, Kenji [Full Text]; Okada, Shinichiro [Full Text]; Orihashi, Kazumasa [Full Text]; Osako, Motohiko [Abstract] [Full Text]; Otani, Hajime [Abstract] [Full Text]; Oubénaissa, Abdeslam [Abstract] [Full Text]
P: Pataer, Abujiang [Abstract] [Full Text]; Peynet, Jacqueline [Abstract] [Full Text]; Putnam, Joe B. [Abstract] [Full Text]
R: Rao, Vivek [Abstract] [Full Text]; Rodriguez, Rosendo A. [Abstract] [Full Text]; Roth, Jack A. [Abstract] [Full Text]; Roth, Jack A. [Abstract] [Full Text]
S: Sabatier, Michel [Abstract] [Full Text]; SaGbas, Ertan [Full Text]; SanisoGlu, Ilhan [Full Text]; Sasaki, Yuzo [Full Text]; Satoh, Shoichi [Full Text]; Schmid, Franz Xaver [Abstract] [Full Text]; Schulman, Larry L. [Abstract] [Full Text]; Scully, Hugh E. [Abstract] [Full Text]; Sezerman, Özge [Full Text]; Shatari, Tomoo [Full Text]; Sittiwangkul, Rekwan [Abstract] [Full Text]; Smythe, W. Roy [Abstract] [Full Text]; Smythe, W. Roy [Abstract] [Full Text]; Splinter, William M. [Abstract] [Full Text]; Stamm, Christof [Abstract] [Full Text]; Stanley, Alfred W. H. [Abstract] [Full Text]; Stump, David A. [Abstract] [Full Text]; Sueda, Taijiro [Full Text]; Sugarbaker, D. J. [Abstract] [Full Text]; Sugawara, Hiromitsu [Full Text]; Sundt, Thoralf M. [Full Text]; Swedenborg, Jesper [Abstract] [Full Text]; Swisher, Stephen G. [Abstract] [Full Text]; Swisher, Stephen G. [Abstract] [Full Text]
T: Takami, Hiroshi [Full Text]; Tanaba, Yoshiaki [Full Text]; Tchervenkov, Christo I. [Abstract] [Full Text]; Toso, Anna [Abstract] [Full Text]; Triedman, John K. [Abstract] [Full Text]
V: van Haaren, Nicole J. C. W. [Full Text]; Vaporciyan, Ara A. [Abstract] [Full Text]; Verhoye, Jean-Philippe [Abstract] [Full Text]; Verma, Subodh [Abstract] [Full Text]
W: Walsh, Edward P. [Abstract] [Full Text]; Walsh, Garrett L. [Abstract] [Full Text]; Watari, Masanobu [Full Text]; Weerasena, Nihal A. [Abstract] [Full Text]; Weisel, Richard D. [Abstract] [Full Text]; Weisel, Richard D. [Abstract] [Full Text]; Williams, William G. [Abstract] [Full Text]; Willis-Merriman, Kelly [Abstract] [Full Text]
Y: Yamamura, Tadashi [Abstract] [Full Text]; Yamauchi, Hideyuki [Full Text]; Yau, Terrence M. [Abstract] [Full Text]; Yau, Terrence M. [Abstract] [Full Text]; Yokomuro, Hiroki [Abstract] [Full Text]; Young, Jason A. [Abstract] [Full Text]; Yu, Robert [Abstract] [Full Text]
Z: Zurakowski, David [Abstract] [Full Text]