JTCS -- Index by Author (121 [2])

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Year:		Vol:		Page:

Index by Author: Feb 2001; 121 (2) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Adams, David H. [Full Text]; Ancona, Ermanno [Full Text]; Andre, Fabrice [Full Text]; Appasani, Krishnarao [Abstract] [Full Text]; Armstrong, Sue [Abstract] [Full Text]
B: Baidoshvili, A. [Abstract] [Full Text]; Bellinger, David C. [Abstract] [Full Text]; Beranek, Jiri T. [Full Text]; Bergqvist, David [Abstract] [Full Text]; Boineau, John P. [Abstract] [Full Text]; Bourel, Patrick [Full Text]; Bueno, Raphael [Abstract] [Full Text]; Burkhoff, Daniel [Abstract] [Full Text]; Byrne, John G. [Full Text]
C: Cagol, Matteo [Full Text]; Capannini, Gianni [Abstract] [Full Text]; Carone, Enrico [Abstract] [Full Text]; Chaillon-Fracchia, Evelyne [Abstract] [Full Text]; Chen, Raymond H. [Full Text]; Christiansson, Lennart [Abstract] [Full Text]; Cohen, Gideon [Abstract] [Full Text]; Corré, Alain [Full Text]; Crystal, George J. [Abstract] [Full Text]
D: Danielson, Gordon K. [Abstract] [Full Text]; David, Tirone E. [Abstract] [Full Text]; Dearani, Joseph A. [Abstract] [Full Text]; Dervanian, Patrice [Abstract] [Full Text]; Diciolla, Francesco [Abstract] [Full Text]; Discigil, Berent [Abstract] [Full Text]; Donahue, Philip E. [Full Text]; du Plessis, Adre J. [Abstract] [Full Text]; Dzau, Victor J. [Full Text]
E: Ehsan, Afshin [Full Text]; Eijsman, L. [Abstract] [Full Text]
F: Farivar, R. Saeid [Full Text]; Feindel, Christopher M. [Abstract] [Full Text]; Fischer, Stefan [Abstract] [Full Text]; Flores, Raja M. [Full Text]; Follette, David M. [Full Text]; Folliguet, Thierry [Full Text]; Formigari, Roberto [Full Text]; Fritz, J. [Abstract] [Full Text]
G: Garabédian, Eréa Noel [Full Text]; Gargiulo, Gaetano [Full Text]; Geha, Alexander S. [Full Text]; Golden, Jeffrey A. [Abstract] [Full Text]; Goodnight, James E. [Full Text]; Griese, Daniel P. [Full Text]; Grunewald, Dominique [Full Text]; Gu, Anguo [Abstract] [Full Text]
H: Hachida, Mitsuhiro [Abstract] [Full Text]; Hagler, Donald J. [Abstract] [Full Text]; Halline, Allan G. [Full Text]; Hansen, Roland [Abstract] [Full Text]; Hashimoto, Mitsunori [Abstract] [Full Text]; Hashmi, Yahya J. [Abstract] [Full Text]; Hellberg, Anders [Abstract] [Full Text]; Hetzer, Roland [Abstract] [Full Text]; Holmuhamedov, Ekhson L. [Abstract] [Full Text]; Houyel, Lucile [Abstract] [Full Text]; Hughes, C. F. [Full Text]
I: Ikeda, E. [Full Text]; Istad, Reidar [Abstract] [Full Text]; Ivanov, Joan [Abstract] [Full Text]
J: Jahangir, Arshad [Abstract] [Full Text]; Jonas, Richard A. [Abstract] [Full Text]; Jonas, Richard A. [Full Text]
K: Kaiser, Larry R. [Abstract] [Full Text]; Karacagil, Sadettin [Abstract] [Full Text]; Keshavjee, Shaf [Abstract] [Full Text]; Kim, Dong-Kwan [Abstract] [Full Text]; Koster, Andreas [Abstract] [Full Text]; Krause, Jürgen [Full Text]; Kuppe, Herrmann [Abstract] [Full Text]; Kurth, C. Dean [Abstract] [Full Text]
L: Laborde, François [Full Text]; Lambert, Virginie [Abstract] [Full Text]; Lankford, Edward B. [Abstract] [Full Text]; Le Bret, Emmanuel [Full Text]; Le Chevalier, Thierry [Full Text]; Lee, Richard [Abstract] [Full Text]; Leppänen, Olli [Abstract] [Full Text]; Lester, Susan [Abstract] [Full Text]; Levine, Sanford [Abstract] [Full Text]; Loebe, Matthias [Abstract] [Full Text]; Losay, Jean [Abstract] [Full Text]
M: Müller, Johannes [Abstract] [Full Text]; Macé, Loïc [Abstract] [Full Text]; Macchiarini, Paolo [Full Text]; Maciocco, Marco [Abstract] [Full Text]; Mackie, J. C. [Full Text]; Mahomed, Yousuf [Full Text]; Mann, Michael J. [Full Text]; Massad, Malek G. [Full Text]; Massetti, Massimo [Abstract] [Full Text]; McCann, John [Abstract] [Full Text]; McIntyre, Brendan [Abstract] [Full Text]; McKneally, Martin F. [Full Text]; Mendoza, Cesar Emilio [Full Text]; Mercer, Harriet [Abstract] [Full Text]; Merigliano, Stefano [Full Text]; Mertzlufft, Fritz [Abstract] [Full Text]; Miller, John M. [Full Text]; Mitsuno, Masataka [Abstract] [Full Text]; Molena, Daniela [Full Text]; Morello, Rémy [Abstract] [Full Text]; Muranaka, Hiroyuki [Abstract] [Full Text]
N: Nakanishi, Ryoichi [Abstract] [Full Text]; Nemoto, Edwin M. [Abstract] [Full Text]; Neri, Eugenio [Abstract] [Full Text]; Neveux, Jean-Yves [Abstract] [Full Text]; Newburger, Jane W. [Abstract] [Full Text]; Nguyen, Ninh T. [Full Text]; Niessen, H. W. M. [Abstract] [Full Text]; Nitta, Takashi [Abstract] [Full Text]
O: Øvrum, Eivind [Abstract] [Full Text]; Øystese, Rolf [Abstract] [Full Text]; O'Blenes, Stacy B. [Abstract] [Full Text]; O'Hara, Irene B. [Abstract] [Full Text]; Ozcan, Cevher [Abstract] [Full Text]
P: Pacheco, Primo [Full Text]; Patel, Arvind [Full Text]; Patel, B. [Full Text]; Peters, P. [Full Text]; Picchio, Fernando M. [Full Text]; Pigula, Frank A. [Abstract] [Full Text]; Pineau, Emmanuelle [Full Text]; Piot, Dominique [Abstract] [Full Text]; Potapov, Evgenij V. [Abstract] [Full Text]; Priestley, Margaret A. [Abstract] [Full Text]; Puga, Francisco J. [Abstract] [Full Text]
R: Rabinovitch, Marlene [Abstract] [Full Text]; Raghunath, Teralandur [Full Text]; Rappaport, Leonard A. [Abstract] [Full Text]; Ringdal, Mari Anne L. [Abstract] [Full Text]; Riviello, James [Abstract] [Full Text]; Roberts, Peter F. [Full Text]; Roger, Gilles [Full Text]; Rokkas, Chris K. [Abstract] [Full Text]; Romanelli, Alberto [Abstract] [Full Text]; Rosado, Manuel Francisco [Full Text]; Rosin, R. D. [Full Text]; Roviaro, Giancarlo [Abstract] [Full Text]; Rubeiz, Helene [Full Text]; Ruol, Alberto [Full Text]
S: Sassi, Carlo [Abstract] [Full Text]; Savage, Edward B. [Full Text]; Scappin, Sabrina [Full Text]; Schaff, Hartzell V. [Abstract] [Full Text]; Schröder, Carsten [Full Text]; Schuessler, Richard B. [Abstract] [Full Text]; Sciacca, Robert R. [Abstract] [Full Text]; Scolletta, Sabino [Abstract] [Full Text]; Shimizu, Juichiro [Abstract] [Full Text]; Shrager, Joseph B. [Abstract] [Full Text]; Siewers, Ralph D. [Abstract] [Full Text]; Snow, Norman [Full Text]; Sodian, Ralf [Abstract] [Full Text]; Stedman, Hansell H. [Abstract] [Full Text]; Stooker, W. [Abstract] [Full Text]; Suehiro, Kotaro [Abstract] [Full Text]; Sugarbaker, David [Abstract] [Full Text]
T: Tangen, Geir [Abstract] [Full Text]; Terzic, Andre [Abstract] [Full Text]; Toscano, Thomas [Abstract] [Full Text]; Tsubota, Noriaki [Full Text]; Tucci, Enrico [Abstract] [Full Text]
U: Ulus, A. Tulga [Abstract] [Full Text]; Umesue, Masayoshi [Abstract] [Full Text]
V: Van Hinsbergh, V. W. M. [Abstract] [Full Text]; Van Schil, Paul E. [Full Text]; Varoli, Federico [Abstract] [Full Text]; Vergani, Contardo [Abstract] [Full Text]; Vogel, Bernd [Full Text]; von Segesser, Ludwig K. [Full Text]; Vouhé, Pascal [Full Text]
W: Wahl, Peter [Abstract] [Full Text]; Wang, Jie [Abstract] [Full Text]; Warnes, Carole A. [Abstract] [Full Text]; Westman, Jan [Abstract] [Full Text]; Wildevuur, W. R. [Abstract] [Full Text]; Wildevuur, C. R. H. [Abstract] [Full Text]; Wypij, David [Abstract] [Full Text]
Y: Yasumoto, Kosei [Abstract] [Full Text]; Yi, Geng-Hua [Abstract] [Full Text]
Z: Zaninotto, Giovanni [Full Text]; Zhu, Shu-Ming [Abstract] [Full Text]