JTCS -- Index by Author (127 [2])

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Index by Author: Feb 2004; 127 (2) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abdulhamid, Mohamed [Abstract] [Full Text]; Abecasis, Miguel [Abstract] [Full Text]; Aguiar, Carlos [Abstract] [Full Text]; Akintürk, Hakan K. [Extract] [Full Text]; Alessandrini, Francesco [Abstract] [Full Text]; Anastassiou, Peter [Extract] [Full Text]; Aoe, Motoi [Abstract] [Full Text]; Applebaum, Robert [Abstract] [Full Text]; Arbatli, Harun [Abstract] [Full Text]; Aru, Giorgio M. [Extract] [Full Text]; Astras, George M. [Abstract] [Full Text]; Atz, Andrew M. [Abstract] [Full Text]
B: Baek, Wan Ki [Extract] [Full Text]; Bagaev, Eric [Extract] [Full Text]; Balkanay, Mehmet [Extract] [Full Text]; Balser, Markus [Abstract] [Full Text]; Barner, Elesa W. [Abstract] [Full Text]; Barr, Mark L. [Abstract] [Full Text]; Bart, Candace W. [Abstract] [Full Text]; Bart, Robert D. [Abstract] [Full Text]; Bax, Jeroen J. [Abstract] [Full Text]; Beek, Johan F. [Abstract] [Full Text]; Benekli, Mustafa [Extract] [Full Text]; Berkun, Yackov [Abstract] [Full Text]; Bernecker, O. [Abstract] [Full Text]; Bidani, Rakesh [Extract] [Full Text]; Boersma, Eric [Abstract] [Full Text]; Bonaros, N. [Abstract] [Full Text]; Bonatti, J. [Abstract] [Full Text]; Bonnet, Damien [Extract] [Full Text]; Börgermann, Jochen [Abstract] [Full Text]; Börgermann, Jochen [Abstract] [Full Text]; Borst, Cornelius [Abstract] [Full Text]; Boudjemline, Younes [Extract] [Full Text]; Bove, Edward L. [Abstract] [Full Text]; Bozbuga, Nilgun [Extract] [Full Text]; Bradley, Scott M. [Abstract] [Full Text]; Bremner, Ross M. [Abstract] [Full Text]; Brinkmann, Matthias [Abstract] [Full Text]; Buijsrogge, Marc P. [Abstract] [Full Text]; Butler, Paris D. [Abstract] [Full Text]
C: Caldarone, Christopher A. [Abstract] [Full Text]; Call, Kenneth D. [Extract] [Full Text]; Carbray, JoAnn [Abstract] [Full Text]; Cellini, Carlo [Abstract] [Full Text]; Cerchierini, Elisa [Extract] [Full Text]; Cheanvechai, Vasana [Extract] [Full Text]; Cheanvechai, Vasana [Extract] [Full Text]; Cheanvechai, Vasana [Extract] [Full Text]; Cheanvechai, Vasana [Extract] [Full Text]; Chen, G. Aaron [Abstract] [Full Text]; Chen, Yih-Sharng [Extract] [Full Text]; Cheng, Fen-Fen [Extract] [Full Text]; Chevtchik, O. [Abstract] [Full Text]; Chi, Nai-Hsin [Extract] [Full Text]; Cho, Jae Hwa [Extract] [Full Text]; Cirkovic, Milan V. [Extract] [Full Text]; Cole, George [Abstract] [Full Text]; Colvin, Stephen B. [Abstract] [Full Text]; Conti, Robert R. [Extract] [Full Text]; Corno, Antonio F. [Extract] [Full Text]; Crane, John K. [Extract] [Full Text]; Crawford, Fred A. [Extract] [Full Text]; Crivellari, Martina [Extract] [Full Text]; Crystal, Ronald G. [Abstract] [Full Text]; Crystal, Ronald G. [Abstract] [Full Text]; Culliford, Alfred T. [Abstract] [Full Text]; Cunningham, Mark J. [Abstract] [Full Text]
D: Danielson, Gordon K. [Abstract] [Full Text]; Danielson, Gordon K. [Extract] [Full Text]; Date, Hiroshi [Abstract] [Full Text]; Davis, B. B. [Extract] [Full Text]; Dearani, Joseph A. [Abstract] [Full Text]; Dearani, Joseph A. [Extract] [Full Text]; Devaney, Eric J. [Abstract] [Full Text]; Dion, Robert [Abstract] [Full Text]; Doctor, Allan [Abstract] [Full Text]
E: Elami, Amir [Abstract] [Full Text]; Elefteriades, John A. [Extract] [Full Text]; Elhendy, Abdou [Abstract] [Full Text]; Eliassen, F. [Abstract] [Full Text]; Ellman, Peter I. [Abstract] [Full Text]; Enelow, Richard I. [Abstract] [Full Text]; Eren, Ercan [Extract] [Full Text]; Esser, Karyn [Abstract] [Full Text]
F: Farivar, Alexander S. [Abstract] [Full Text]; Farstad, M. [Abstract] [Full Text]; Feindel, Chris [Extract] [Full Text]; Ferrazzi, Paolo [Abstract] [Full Text]; Ferreira, Manuel [Abstract] [Full Text]; Fiocchi, Roberto [Abstract] [Full Text]; Foroulis, Christophoros N. [Abstract] [Full Text]; Fraga, Charles [Abstract] [Full Text]; Freischlag, Julie A. [Extract] [Full Text]; Freischlag, Julie A. [Extract] [Full Text]; Freischlag, Julie A. [Extract] [Full Text]; Freischlag, Julie A. [Extract] [Full Text]; Friedrich, G. [Abstract] [Full Text]; Friedrich, Ivar [Abstract] [Full Text]; Friedrich, Ivar [Abstract] [Full Text]; Fukumoto, Yukiomi [Extract] [Full Text]
G: Gahtan, Vivian [Extract] [Full Text]; Gahtan, Vivian [Extract] [Full Text]; Gahtan, Vivian [Extract] [Full Text]; Gahtan, Vivian [Extract] [Full Text]; Galloway, Aubrey C. [Abstract] [Full Text]; Gamba, Amando [Abstract] [Full Text]; Gaston, Benjamin [Abstract] [Full Text]; Gaudino, Mario [Abstract] [Full Text]; Girola, Fabiana [Abstract] [Full Text]; Glieca, Franco [Abstract] [Full Text]; Goldberg, Caren S. [Abstract] [Full Text]; Golden, Jeffrey [Extract] [Full Text]; Goldschmidt, Robert A. [Abstract] [Full Text]; Gomez, Carlen A. [Abstract] [Full Text]; Gotoh, Masashi [Abstract] [Full Text]; Graham, Linda M. [Extract] [Full Text]; Graham, Linda M. [Extract] [Full Text]; Graham, Linda M. [Extract] [Full Text]; Graham, Linda M. [Extract] [Full Text]; Graves, Holly L. [Abstract] [Full Text]; Grossi, Eugene A. [Abstract] [Full Text]; Gründeman, Paul F. [Abstract] [Full Text]; Günther, Andreas [Abstract] [Full Text]; Günther, Andreas [Abstract] [Full Text]
H: Haddy, Steven M. [Abstract] [Full Text]; Hagl, Christian [Abstract] [Full Text]; Hall, Timothy S. [Extract] [Full Text]; Hammel, James M. [Abstract] [Full Text]; Han, Hae Seung [Extract] [Full Text]; Harthun, Nancy L. [Extract] [Full Text]; Harthun, Nancy L. [Extract] [Full Text]; Harthun, Nancy L. [Extract] [Full Text]; Harthun, Nancy L. [Extract] [Full Text]; Haverich, Axel [Abstract] [Full Text]; Haverich, Axel [Extract] [Full Text]; Hayama, Makio [Abstract] [Full Text]; Heidt, Martin C. [Extract] [Full Text]; Heltne, J. K. [Abstract] [Full Text]; Hess, John [Abstract] [Full Text]; Hirabayashi, Hirohisa [Extract] [Full Text]; Hirose, Hajime [Extract] [Full Text]; Huang, Cheng-Long [Abstract] [Full Text]; Huang, Shu-Chien [Extract] [Full Text]; Huikeshoven, Menno [Abstract] [Full Text]; Husby, P. [Abstract] [Full Text]
I: Ihara, Katsuhiko [Extract] [Full Text]; Ikonomidis, John S. [Extract] [Full Text]; Iliopoulou, Eugenia [Abstract] [Full Text]; Inokawa, Hidetoshi [Abstract] [Full Text]; Ishino, Kozo [Extract] [Full Text]
J: Jablons, David M. [Extract] [Full Text]; Jakovljevic, Miroslav M. [Extract] [Full Text]; Jones, Kirk [Extract] [Full Text]; Jovic, Miomir Dj. [Extract] [Full Text]
K: Kallenbach, Klaus [Abstract] [Full Text]; Kanchuger, Marc [Abstract] [Full Text]; Kantidakis, George H. [Abstract] [Full Text]; Karck, Matthias [Abstract] [Full Text]; Karimi, Mohsen [Abstract] [Full Text]; Kasimir, Marie-Theres [Abstract] [Full Text]; Katayama, Akira [Extract] [Full Text]; Katayama, Keijiro [Extract] [Full Text]; Kato, Takayoshi [Extract] [Full Text]; Katz, Jeffery [Extract] [Full Text]; Katz, Nathaniel [Extract] [Full Text]; Kawada, Masaaki [Extract] [Full Text]; Keles, Cüneyt [Extract] [Full Text]; Kern, John A. [Abstract] [Full Text]; Kieser, Teresa [Extract] [Full Text]; Kim, David [Abstract] [Full Text]; Kim, Jung Taek [Extract] [Full Text]; Kim, Kwang Ho [Extract] [Full Text]; Kim, Peter Y. [Extract] [Full Text]; Kim, Young Sam [Extract] [Full Text]; Kirschner, S. [Extract] [Full Text]; Klima, Uwe [Extract] [Full Text]; Knezevic, Aleksandar M. [Extract] [Full Text]; Ko, Wen-Je [Extract] [Full Text]; Komatsu, Tsunehiro [Abstract] [Full Text]; Kopf, Gary S. [Extract] [Full Text]; Korst, Robert J. [Abstract] [Full Text]; Kostolny, Martin [Abstract] [Full Text]; Kramer, Miranda J. [Extract] [Full Text]; Kremzier, Jayne E. [Extract] [Full Text]; Kron, Irving L. [Abstract] [Full Text]; Kron, Irving L. [Abstract] [Full Text]; Kronzon, Itzhak [Abstract] [Full Text]
L: Landoni, Giovanni [Extract] [Full Text]; Landoni, Giovanni [Extract] [Full Text]; Lange, Ruediger [Abstract] [Full Text]; Larobina, Marco [Extract] [Full Text]; Laubach, Victor E. [Abstract] [Full Text]; Laufer, G. [Abstract] [Full Text]; Lee, Jang-Ming [Extract] [Full Text]; Lee, Yung-Chie [Extract] [Full Text]; Leyh, Rainer [Abstract] [Full Text]; Li, Wei Gen [Abstract] [Full Text]; Lin, Fang-Yue [Extract] [Full Text]; Lin, Thy-Sheng [Extract] [Full Text]; Lopez, Becky M. [Abstract] [Full Text]; Luciani, Nicola [Abstract] [Full Text]; Luckraz, H. [Extract] [Full Text]
M: Maeda, Jun [Extract] [Full Text]; Maeda, Katsuhide [Abstract] [Full Text]; Mammana, Carmelo [Abstract] [Full Text]; Mangano, Dennis T. [Extract] [Full Text]; Mann, Michael J. [Extract] [Full Text]; Manohar, Soman Rema Krishna [Extract] [Full Text]; Maringka, Michael [Extract] [Full Text]; Marino, Giovanni [Extract] [Full Text]; Markart, Philipp [Abstract] [Full Text]; Maron, Barry J. [Abstract] [Full Text]; Mascio, Christopher E. [Abstract] [Full Text]; Matsouka, Phaedra [Abstract] [Full Text]; Matsuda, Hikaru [Extract] [Full Text]; Matsumiya, Goro [Extract] [Full Text]; Matsuno, Yukihiro [Extract] [Full Text]; Maxey, Thomas S. [Abstract] [Full Text]; Maxey, Thomas S. [Abstract] [Full Text]; McLean, Catriona [Extract] [Full Text]; Meir, Karen [Abstract] [Full Text]; Melissari, Efthimia N. [Abstract] [Full Text]; Melo, João [Abstract] [Full Text]; Menon, Ares K. [Extract] [Full Text]; Merlo, Maurizio [Abstract] [Full Text]; Merritt, Robert E. [Abstract] [Full Text]; Mevorach, Dror [Abstract] [Full Text]; Minakata, Kenji [Abstract] [Full Text]; Minami, Masato [Extract] [Full Text]; Mitrev, Zan [Extract] [Full Text]; Moizumi, Yoshimasa [Abstract] [Full Text]; Mongstad, A. [Abstract] [Full Text]; Morelli, Mauro [Abstract] [Full Text]; Mori, Yoshio [Extract] [Full Text]; Motoyoshi, Naotaka [Abstract] [Full Text]; Mulligan, Michael S. [Abstract] [Full Text]; Murakami, Arata [Abstract] [Full Text]
N: Nagahiro, Itaru [Abstract] [Full Text]; Naidu, Babu V. [Abstract] [Full Text]; Nakamura, Tatsuo [Abstract] [Full Text]; Nakashima, Yutaka [Extract] [Full Text]; Naparstek, Yaakov [Abstract] [Full Text]; Neelakandhan, Kurur Sankaran [Extract] [Full Text]; Neema, Praveen Kumar [Extract] [Full Text]; Nezic, Dusko G. [Extract] [Full Text]; Nguyen, Dao M. [Abstract] [Full Text]; Nigro, John J. [Abstract] [Full Text]; Niles, Scott D. [Abstract] [Full Text]; Nishimura, Rick A. [Abstract] [Full Text]; Noebauer, Christian [Abstract] [Full Text]; Nomura, Fumikazu [Extract] [Full Text]
O: Ohta, Mitsunori [Extract] [Full Text]; Ohye, Richard G. [Abstract] [Full Text]; Okamoto, Taku [Abstract] [Full Text]; Okazaki, Mikio [Abstract] [Full Text]; Okutani, Daisuke [Abstract] [Full Text]; Olk, Alexander [Abstract] [Full Text]; Onarheim, H. [Abstract] [Full Text]; Ott, H. [Abstract] [Full Text]
P: Palatianos, George M. [Abstract] [Full Text]; Pappalardo, Federico [Extract] [Full Text]; Patejunas, Gerald [Abstract] [Full Text]; Poldermans, Don [Abstract] [Full Text]; Portela, Francisco [Extract] [Full Text]; Possati, Gianfederico [Abstract] [Full Text]; Pragliola, Claudio [Abstract] [Full Text]; Puga, Francisco J. [Extract] [Full Text]; Purohit, Manoj [Extract] [Full Text]
R: Rahman, G. Farah [Abstract] [Full Text]; Ramachandran, Padmakumar [Extract] [Full Text]; Rebocho, Maria [Abstract] [Full Text]; Reddy, Rishindra [Abstract] [Full Text]; Reece, T. Brett [Abstract] [Full Text]; Reidemeister, J. Christoph [Abstract] [Full Text]; Retuerto, Mauricio A. [Abstract] [Full Text]; Rhein, Christine [Abstract] [Full Text]; Ribakove, Greg H. [Abstract] [Full Text]; Rieder, Erwin [Abstract] [Full Text]; Ritchie, A. I. [Extract] [Full Text]; Rizzello, Vittoria [Abstract] [Full Text]; Roelandt, Jos R.T.C. [Abstract] [Full Text]; Rosengart, Matthew [Abstract] [Full Text]; Rosengart, Todd K. [Abstract] [Full Text]; Roth, Peter [Extract] [Full Text]; Rynning, S. E. [Abstract] [Full Text]
S: Saltman, Adam E. [Extract] [Full Text]; Sano, Shunji [Extract] [Full Text]; Sano, Yoshifumi [Abstract] [Full Text]; Sareyyupoglu, Basar [Extract] [Full Text]; Saunders, Paul C. [Abstract] [Full Text]; Schachner, T. [Abstract] [Full Text]; Schalch, Paul [Abstract] [Full Text]; Schinkel, Arend F. L. [Abstract] [Full Text]; Schmidt, Reinhold [Abstract] [Full Text]; Schmidt, Reinhold [Abstract] [Full Text]; Scholz, Thomas D. [Abstract] [Full Text]; Schreiber, Christian [Abstract] [Full Text]; Schrump, David S. [Abstract] [Full Text]; Schrump, William D. [Abstract] [Full Text]; Schwartz, Daniel S. [Abstract] [Full Text]; Sebastiani, Roberta [Abstract] [Full Text]; Seebacher, Gernot [Abstract] [Full Text]; Seeger, Werner [Abstract] [Full Text]; Seeger, Werner [Abstract] [Full Text]; Segar, Jeffrey L. [Abstract] [Full Text]; Sharony, Ram [Abstract] [Full Text]; Shigemura, Norihisa [Extract] [Full Text]; Shimizu, Nobuyoshi [Abstract] [Full Text]; Shimizu, Yasuhiko [Abstract] [Full Text]; Shiono, Hiroyuki [Extract] [Full Text]; Shon, Kuk Hee [Extract] [Full Text]; Sidi, Daniel [Extract] [Full Text]; Silber, Rolf E. [Abstract] [Full Text]; Silberhumer, Gerd [Abstract] [Full Text]; Simon, Paul [Abstract] [Full Text]; Simsic, Janet M. [Abstract] [Full Text]; Sonmez, Bingur [Abstract] [Full Text]; Sparicio, Donatella [Extract] [Full Text]; Sparicio, Donatella [Extract] [Full Text]; Splittgerber, Fred H. [Abstract] [Full Text]; Splittgerber, Fred H. [Abstract] [Full Text]; Starnes, Vaughn A. [Abstract] [Full Text]; Suyker, Paul T. W. [Abstract] [Full Text]; Suyker, Willem J. L. [Abstract] [Full Text]
T: Tabata, Yasuhiko [Abstract] [Full Text]; Tabayashi, Koichi [Abstract] [Full Text]; Takagi, Hisato [Extract] [Full Text]; Takamoto, Shinichi [Abstract] [Full Text]; Tamura, Kentaro [Extract] [Full Text]; Tansal, Selim [Abstract] [Full Text]; Terzi, Amedeo [Abstract] [Full Text]; Thomas, Robert [Abstract] [Full Text]; Tijssen, Jan G. P. [Abstract] [Full Text]; Timóteo, Ana [Abstract] [Full Text]; Titus, Thomas [Extract] [Full Text]; Tribble, Curtis G. [Abstract] [Full Text]; Tsai, Wilson [Abstract] [Full Text]; Tseng, Yau-Lin [Extract] [Full Text]; Tukkie, Raymond [Abstract] [Full Text]
U: Umeda, Yukio [Extract] [Full Text]
V: van der Meulen, Jan [Abstract] [Full Text]; van der Sloot, Jos A. P. [Abstract] [Full Text]; van Eck-Smit, Berthe L. F. [Abstract] [Full Text]; van Gemert, Martin J. C. [Abstract] [Full Text]; Vander Salm, Thomas J. [Extract] [Full Text]; Vanoverschelde, Jean-Louis J. [Abstract] [Full Text]; Varma, Praveen K. [Extract] [Full Text]; Vassili, Maria I. [Abstract] [Full Text]; Verberne, Hein J. [Abstract] [Full Text]; Verlaan, Cees W. J. [Abstract] [Full Text]; Vogt, Paul R. [Extract] [Full Text]; Voigt, Peter [Abstract] [Full Text]; Vukovic, Milan M. [Extract] [Full Text]
W: Wacker, Annett [Abstract] [Full Text]; Wang, Jou-Kou [Extract] [Full Text]; Wang, Li Xing [Abstract] [Full Text]; Wang, Shoei-Shen [Extract] [Full Text]; Warrier, Girish [Extract] [Full Text]; Weidinger, F. [Abstract] [Full Text]; Weigel, Guenter [Abstract] [Full Text]; Weipert, Joachim [Abstract] [Full Text]; Wells, Winfield J. [Abstract] [Full Text]; Wolner, Ernst [Abstract] [Full Text]; Woolley, Steven M. [Abstract] [Full Text]; Wu, Ming-Ho [Extract] [Full Text]
Y: Yakut, Cevat [Extract] [Full Text]; Yamada, Reiko E. [Abstract] [Full Text]; Yamaki, Shigeo [Abstract] [Full Text]; Yamamoto, Yasumichi [Abstract] [Full Text]; Yokomise, Hiroyasu [Abstract] [Full Text]; Yokota, Michio [Abstract] [Full Text]; Yoon, Yong Han [Extract] [Full Text]; Yoshitatsu, Masao [Extract] [Full Text]; Yoshizumi, Ko [Extract] [Full Text]; Yu, Hsi-Yu [Extract] [Full Text]
Z: Zangrillo, Alberto [Extract] [Full Text]; Zangrillo, Alberto [Extract] [Full Text]; Zavanella, Claudio [Extract] [Full Text]; Zrenner, Bernhard [Abstract] [Full Text]